Patents by Inventor Remco Johannes Petrus Geurts

Remco Johannes Petrus Geurts has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11355305
    Abstract: Methods and systems for creating TEM lamella using image restoration algorithms for low keV FIB images are disclosed. An example method includes irradiating a sample with an ion beam at low keV settings, generating a low keV ion beam image of the sample based on emissions resultant from irradiation by the ion beam, and then applying an image restoration model to the low keV ion beam image of the sample to generate a restored image. The sample is then localized within the restored image, and a low keV milling of the sample is performed with the ion beam based on the localized sample within the restored image.
    Type: Grant
    Filed: October 8, 2019
    Date of Patent: June 7, 2022
    Assignee: FEI Company
    Inventors: Remco Johannes Petrus Geurts, Pavel Potocek, Maurice Peemen, Ondrej Machek
  • Publication number: 20210104375
    Abstract: Methods and systems for creating TEM lamella using image restoration algorithms for low keV FIB images are disclosed. An example method includes irradiating a sample with an ion beam at low keV settings, generating a low keV ion beam image of the sample based on emissions resultant from irradiation by the ion beam, and then applying an image restoration model to the low keV ion beam image of the sample to generate a restored image. The sample is then localized within the restored image, and a low keV milling of the sample is performed with the ion beam based on the localized sample within the restored image.
    Type: Application
    Filed: October 8, 2019
    Publication date: April 8, 2021
    Applicant: FEI Company
    Inventors: Remco Johannes Petrus Geurts, Pavel Potocek, Maurice Peemen, Ondrej Machek