Patents by Inventor Remi Hardy

Remi Hardy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9477602
    Abstract: A method and a device are disclosed for a cache memory refill control.
    Type: Grant
    Filed: August 8, 2008
    Date of Patent: October 25, 2016
    Assignee: Intel Deutschland GmbH
    Inventors: Remi Hardy, Vincent Rezard
  • Publication number: 20100037026
    Abstract: A method and a device are disclosed for a cache memory refill control.
    Type: Application
    Filed: August 8, 2008
    Publication date: February 11, 2010
    Applicant: Infineon Technologies AG
    Inventors: Remi Hardy, Vincent Rezard
  • Patent number: 7532993
    Abstract: Devices including trimmable electric units and methods for providing trim values to electric units. A device includes a trimmable electric unit, at least one fuse to provide at least one first trim value, and a trim value provision unit to provide at least one second trim value, and a register. The register, which is connected to the electric unit, the at least one fuse, and the trim value provision unit, selectively stores the first and/or the second trim values and provides them to the electric unit.
    Type: Grant
    Filed: February 26, 2007
    Date of Patent: May 12, 2009
    Assignee: Infineon Technologies AG
    Inventors: Remi Hardy, Vincent Rezard
  • Publication number: 20080204119
    Abstract: Devices comprising trimmable electric units and methods for providing trim values to electric units are presented herein. One such device comprises a trimmable electric unit, at least one fuse to provide at least one first trim value, and a trim value provision unit to provide at least one second trim value, and a register. The register, which is connected to the electric unit, the at least one fuse, and the trim value provision unit, selectively stores the first and/or the second trim values and provides them to the electric unit. Optionally, a third trim value may be used. In the case of integrated circuits, provision of the trim values allows for on-chip debugging without waiting for creation of a test program used by automatic testing equipment at the wafer probe stage.
    Type: Application
    Filed: February 26, 2007
    Publication date: August 28, 2008
    Applicant: Infineon Technologies AG
    Inventors: Remi Hardy, Vincent Rezard