Patents by Inventor Ren-Chieh Fung

Ren-Chieh Fung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical calibration and testing device for machine tools
    Patent number: 8542358
    Abstract: An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.
    Type: Grant
    Filed: March 30, 2011
    Date of Patent: September 24, 2013
    Assignee: National Formosa University
    Inventors: Wen-Yuh Jywe, Chia-Hung Wu, I-Ching Chen, Tung-Hui Hsu, Ren-Chieh Fung, Teng-Yu Yang
  • Optical Calibration and Testing Device for Machine Tools
    Publication number: 20110261348
    Abstract: An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.
    Type: Application
    Filed: March 30, 2011
    Publication date: October 27, 2011
    Inventors: Wen-Yuh Jywe, Chia-Hung Wu, I-Ching Chen, Tung-Hui Hsu, Ren-Chieh Fung, Teng-Yu Yang