Abstract: Provided a connector including a first female connector and a first male connector. The first female connector includes a first male sleeve, and a probe is disposed on the first male sleeve. The first male connector includes a first female sleeve, in which an elastic structure is disposed in the first female sleeve. The probe passes through a hole on the first male sleeve and is electrically connected to a second female sleeve in a second male connector. The elastic structure is electrically connected to a second male sleeve in a second female connector.

Abstract: A solar photovoltaic system includes a solar cell array, a bypass diode and a light-emitting module. The solar cell array has a positive terminal and a negative terminal and includes a plurality of solar cells connected in series. The bypass diode is connected to the solar cell array in parallel. The light-emitting module is connected to the solar cell array in parallel and includes a Zener diode and a light-emitting diode. The Zener diode has a cathode and an anode electrically connected to the positive terminal and the negative terminal of the solar cell array, respectively. The light-emitting diode is connected to the Zener diode in series. The light-emitting module has a threshold voltage which is a breakdown voltage of the Zener diode and related to a voltage of a maximum power of the solar cell array under a standard illuminance.

Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error is not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.

Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.

Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error s not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.

Abstract: A sterilizing device comprises a light guiding member and an ultraviolet (UV) light source. The light guiding member has a surface. The UV light source emits UV light rays such that the UV light rays are guided into the guiding member based on a total internal reflection. When an object contacts or comes close to the surface, an evanescent wave from the UV light rays irradiates on the object.

Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.

Abstract: A measurement system having a light source, a holding device, and a measurement device. The light source includes a plurality of light emitting diodes (LEDs) configured to generate light beams with different wavelengths, and the emission spectrum of the light source complies with a predetermined standard. The holding device is configured to hold an object under test. The measurement device is configured to measure the electrical properties of the object under test after the object under test is illuminated by the light source.

Abstract: In one exemplary embodiment, an electrical characteristic measuring apparatus of solar cell comprises a resilient metal attached to a bus bar of a solar cell and a conducting device located at one end of the resilient metal. The resilient metal has an open via, and the conducting device contacts with the bus bar through the open via. The electrical characteristic measuring apparatus is attached to the bus bar located at a front plane of solar cell. The resilient metal and the conducting device, respectively, connect electrically to a testing device contacted to electrode located at the back plane of solar cell. Thus the resilient metal, the testing device, and the electrode of the back plane form a current measuring loop, and the conducting device, the testing device, and the electrode of the back plane form a voltage measuring loop.

Abstract: A sterilizing device comprises a light guiding member and an ultraviolet (UV) light source. The light guiding member has a surface. The UV light source emits UV light rays such that the UV light rays are guided into the guiding member based on a total internal reflection. When an object contacts or comes close to the surface, an evanescent wave from the UV light rays irradiates on the object.

Abstract: A measurement system having a light source, a holding device, and a measurement device. The light source includes a plurality of light emitting diodes (LEDs) configured to generate light beams with different wavelengths, and the emission spectrum of the light source complies with a predetermined standard. The holding device is configured to hold an object under test. The measurement device is configured to measure the electrical properties of the object under test after the object under test is illuminated by the light source.