Patents by Inventor Ren Yi YOU

Ren Yi YOU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10399394
    Abstract: A sensor module is provided that includes a magnetic sensor and a microcontroller. The magnetic sensor is configured to measure a magnitude of a magnetic field component of an Earth magnetic field projected on a sensing axis of the magnetic sensor and is configured to generate a measurement signal. The magnetic sensor is configured to rotate about an axis through the Earth magnetic field such that the measurement signal oscillates between a first and second extremas as the magnitude of the magnetic field component projected onto the sensing axis changes due to rotation of the magnetic sensor about the axis. The microcontroller is configured to receive the measurement signal, acquire a predetermined number of measurement samples over a sampling period, calculate a variance value of the acquired measurement samples, and determine whether the magnetic sensor is rotating about the axis based on a threshold test of the variance value.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: September 3, 2019
    Assignee: Infineon Technologies AG
    Inventors: Jooil Park, Felix Gow, Thomas Lange, Karine Pillet, Wolfgang Raberg, Maximilian Werner, Ren Yi You
  • Publication number: 20180162183
    Abstract: A sensor module is provided that includes a magnetic sensor and a microcontroller. The magnetic sensor is configured to measure a magnitude of a magnetic field component of an Earth magnetic field projected on a sensing axis of the magnetic sensor and is configured to generate a measurement signal. The magnetic sensor is configured to rotate about an axis through the Earth magnetic field such that the measurement signal oscillates between a first and second extremas as the magnitude of the magnetic field component projected onto the sensing axis changes due to rotation of the magnetic sensor about the axis. The microcontroller is configured to receive the measurement signal, acquire a predetermined number of measurement samples over a sampling period, calculate a variance value of the acquired measurement samples, and determine whether the magnetic sensor is rotating about the axis based on a threshold test of the variance value.
    Type: Application
    Filed: December 14, 2016
    Publication date: June 14, 2018
    Applicant: Infineon Technologies AG
    Inventors: Jooil PARK, Felix GOW, Thomas LANGE, Karine PILLET, Wolfgang RABERG, Maximilian WERNER, Ren Yi YOU