Abstract: A testing system includes one or more processors; and a memory storing instructions that, when executed, cause the one or more processors to: perform, on each array of an SRAM of a System-on-a-Chip (SoC), the SRAM having a plurality of arrays, one or more tests to determine one or more biased cells in the array, generate bias characteristics for each array of the SRAM based on the one or more biased cells of the array, compare bias characteristics of each of the plurality of arrays, select, based on the comparison, an array of the plurality of arrays as a Physically Unclonable Function (PUF) array, and store an identifier of the PUF array into a memory of the SoC.

Abstract: An example method includes identifying, by processing circuitry, a Physically Unclonable Function (PUF) array selected from a static random-access memory (SRAM) device of a System-on-a-Chip (SoC); reading, by the processing circuitry, from a memory, helper data associated with the PUF array and usable for generating a cryptographic key based on the PUF array; determining, by the processing circuitry, whether the helper data associated with the PUF array has been altered after its initial generation by a test system; and in response to determining that the helper data associated with the PUF array has been altered, disabling access to data, software, or functions protected by the cryptographic key generated based on the PUF array.