Abstract: The presently-disclosed technology enables real-time inspection of a multitude of subcomponents of a component in parallel. For example, the component may be a semiconductor package, and the subcomponents may include through-silicon vias. One embodiment relates to a method for inspecting multiple subcomponents of a component for defects, the method comprising, for each subcomponent undergoing defect detection: extracting a subcomponent image from image data of the component; computing a transformed feature vector from the subcomponent image; computing pairwise distances from the transformed feature vector to each transformed feature vector in a training set; determining a proximity metric using said pairwise distances; and comparing the proximity metric against a proximity threshold to detect a defect in the subcomponent. Another embodiment relates to a product manufactured using a disclosed method of inspecting multiple subcomponents of a component for defects.

Abstract: The present disclosure describes techniques for training a model and improving game performance using the model. The disclosed techniques comprise obtaining a plurality of sets of game data from a plurality of terminal devices, the plurality of sets of game data being stored in a plurality of segment replay buffers; sampling the plurality of sets of game data based on a predetermined priority and obtaining a sampling result; inputting the sampling result into a loss function and training a model by using a calculation result of the loss function; and determining a quality (Q) value of each action performed by a virtual object in a game run on a terminal device among the plurality of terminal devices by using the model.

Abstract: The present disclosure describes techniques for training a model and improving game performance using the model. The disclosed techniques comprise obtaining a plurality of sets of game data from a plurality of terminal devices, the plurality of sets of game data being stored in a plurality of segment replay buffers; sampling the plurality of sets of game data based on a predetermined priority and obtaining a sampling result; inputting the sampling result into a loss function and training a model by using a calculation result of the loss function; and determining a quality (Q) value of each action performed by a virtual object in a game run on a terminal device among the plurality of terminal devices by using the model.

Abstract: The presently-disclosed technology enables real-time inspection of a multitude of subcomponents of a component in parallel. For example, the component may be a semiconductor package, and the subcomponents may include through-silicon vias. One embodiment relates to a method for inspecting multiple subcomponents of a component for defects, the method comprising, for each subcomponent undergoing defect detection: extracting a subcomponent image from image data of the component; computing a transformed feature vector from the subcomponent image; computing pairwise distances from the transformed feature vector to each transformed feature vector in a training set; determining a proximity metric using said pairwise distances; and comparing the proximity metric against a proximity threshold to detect a defect in the subcomponent. Another embodiment relates to a product manufactured using a disclosed method of inspecting multiple subcomponents of a component for defects.