Patents by Inventor Reno Gaertner

Reno Gaertner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Imaging device with alignment analysis
    Patent number: 10397565
    Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
    Type: Grant
    Filed: March 19, 2018
    Date of Patent: August 27, 2019
    Assignee: Fluke Corporation
    Inventors: Jeffrey M. Kresch, Steffen Ludwig, Reno Gärtner
  • IMAGING DEVICE WITH ALIGNMENT ANALYSIS
    Publication number: 20180213221
    Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
    Type: Application
    Filed: March 19, 2018
    Publication date: July 26, 2018
    Inventors: Jeffrey M. Kresch, Steffen Ludwig, Reno Gärtner
  • IMAGING DEVICE WITH ALIGNMENT ANALYSIS
    Publication number: 20180084246
    Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
    Type: Application
    Filed: September 22, 2016
    Publication date: March 22, 2018
    Inventors: Jeffrey M. Kresch, Steffen Ludwig, Reno Gärtner
  • Imaging device with alignment analysis
    Patent number: 9924160
    Abstract: Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
    Type: Grant
    Filed: September 22, 2016
    Date of Patent: March 20, 2018
    Assignee: Fluke Corporation
    Inventors: Jeffrey M. Kresch, Steffen Ludwig, Reno Gärtner
  • Method and system for measuring thermal radiation to determine temperature and emissivity of an object
    Patent number: 8483991
    Abstract: A system and method are disclosed that determines the emissivity and temperature of a target object. A compact emitter capable of sequentially emitting blackbody-like radiation at two different temperatures is used to determine the target object's emissivity and temperature.
    Type: Grant
    Filed: May 15, 2009
    Date of Patent: July 9, 2013
    Assignee: Fluke Corporation
    Inventors: Reno Gaertner, Steffen Ludwig, Rainer Kuepper, Klaus-Peter Moellmann
  • METHOD AND SYSTEM FOR MEASURING THERMAL RADIATION TO DETERMINE TEMPERATURE AND EMISSIVITY OF AN OBJECT
    Publication number: 20100292951
    Abstract: A system and method are disclosed that determines the emissivity and temperature of a target object. A compact emitter capable of sequentially emitting blackbody-like radiation at two different temperatures is used to determine the target object's emissivity and temperature.
    Type: Application
    Filed: May 15, 2009
    Publication date: November 18, 2010
    Applicant: Fluke Corporation
    Inventors: Reno Gaertner, Steffen Ludwig, Rainer Kuepper, Klaus-Peter Moellmann