Patents by Inventor Rhys BUGGY

Rhys BUGGY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Machine-learning-based integrated circuit test case selection
    Patent number: 12657364
    Abstract: Certain aspects of the present disclosure provide techniques and apparatus for testing integrated circuit designs. An example method generally includes generating a coverage matrix associated with a plurality of test cases for an integrated circuit and coverage points associated with each test case of the plurality of test cases. A subset of the plurality of test cases is selected for execution based on weights associated with each test case of the plurality of test cases and a threshold weight value. Generally, the weights associated with each test case comprise weights in a machine learning model trained based on the coverage matrix. The integrated circuit may be tested based on the selected subset of test cases.
    Type: Grant
    Filed: March 21, 2023
    Date of Patent: June 16, 2026
    Assignee: QUALCOMM Incorporated
    Inventors: Gokce Sarar, Guillaume Shippee, Rhys Buggy, Santanu Pattanayak, Tushit Jain, Suman Kumar Gunnala, Kumar Raj, Vatsal Nimeshkumar Thakkar
  • MACHINE-LEARNING-BASED INTEGRATED CIRCUIT TEST CASE SELECTION
    Publication number: 20240320408
    Abstract: Certain aspects of the present disclosure provide techniques and apparatus for testing integrated circuit designs. An example method generally includes generating a coverage matrix associated with a plurality of test cases for an integrated circuit and coverage points associated with each test case of the plurality of test cases. A subset of the plurality of test cases is selected for execution based on weights associated with each test case of the plurality of test cases and a threshold weight value. Generally, the weights associated with each test case comprise weights in a machine learning model trained based on the coverage matrix. The integrated circuit may be tested based on the selected subset of test cases.
    Type: Application
    Filed: March 21, 2023
    Publication date: September 26, 2024
    Inventors: Gokce SARAR, Guillaume SHIPPEE, Rhys BUGGY, Santanu PATTANAYAK, Tushit JAIN, Suman Kumar GUNNALA, Kumar RAJ, Vatsal Nimeshkumar THAKKAR