Abstract: An apparatus for testing of integrated circuits (ICs) has parallel plates arranged at a fixed distance from each other, each having a plurality of aligning bores, and a plurality of equally oriented contact elements made of resilient sheet material. The elements have a first straight end portion sitting in a bore of one of said plates and a second straight end portion sitting in an aligning bore of the other of said plates. A pressure member is used to move an IC toward the outer side of one of the plates and the first end portions of the contact elements, which first ends extend slightly beyond the outer side of one of the plates and form a pattern which corresponds to the pattern of contact points of the IC to be tested.