Patents by Inventor Riccardo VINCELLI

Riccardo VINCELLI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probabilistic metric for random hardware failure
    Patent number: 11182236
    Abstract: A method of determining a probabilistic metric for random hardware failure for an electronic system, such as a microcontroller, which comprises element and safety mechanisms (SMs) is disclosed. The safety mechanisms include first layer safety mechanisms (FL-SMs) and second layer safety mechanisms (SL-SMs). A first layer safety mechanism may provide at least partial coverage of failure of a part and a second layer safety mechanism may provide at least partial coverage of failure of a first layer safety mechanism. The method comprises calculating a first set of probabilities (KSM_i) associated with the first layer safety mechanisms, calculating a second set of probabilities (KDVF_n) associated with direct violation faults in the parts and calculating a third set of probabilities (KIVF_n) associated with indirect violation faults in the parts. The method includes obtaining the value of probabilistic metric for random hardware failure in dependence on the first, second and third sets of probabilities.
    Type: Grant
    Filed: April 13, 2017
    Date of Patent: November 23, 2021
    Assignee: Renesas Electronics Corporation
    Inventors: Riccardo Vincelli, Agostino Cefalo
  • Probabilistic Metric for Random Hardware Failure
    Publication number: 20200081758
    Abstract: A method of determining a probabilistic metric for random hardware failure for an electronic system, such as a microcontroller, which comprises element and safety mechanisms (SMs) is disclosed. The safety mechanisms include first layer safety mechanisms (FL-SMs) and second layer safety mechanisms (SL-SMs). A first layer safety mechanism may provide at least partial coverage of failure of a part and a second layer safety mechanism may provide at least partial coverage of failure of a first layer safety mechanism. The method comprises calculating a first set of probabilities (KSM_i) associated with the first layer safety mechanisms, calculating a second set of probabilities (KDVF_n) associated with direct violation faults in the parts and calculating a third set of probabilities (KIVF_n) associated with indirect violation faults in the parts. The method includes obtaining the value of probabilistic metric for random hardware failure in dependence on the first, second and third sets of probabilities.
    Type: Application
    Filed: April 13, 2017
    Publication date: March 12, 2020
    Inventors: Riccardo Vincelli, Agostino Cefalo
  • Support system and a method of generating and using functional safety data for an electronic component
    Patent number: 9547737
    Abstract: A design support system and a method of generating and using a customizable analysis report comprising functional safety data for an electronic component, such as microcontroller, are described.
    Type: Grant
    Filed: January 16, 2014
    Date of Patent: January 17, 2017
    Assignee: RENESAS ELECTRONICS EUROPE LIMITED
    Inventors: Riccardo Vincelli, Agostino Cefalo, Claudio Tongiani
  • SUPPORT SYSTEM
    Publication number: 20140200699
    Abstract: A design support system and a method of generating and using a customisable analysis report comprising functional safety data for an electronic component, such as microcontroller, are described.
    Type: Application
    Filed: January 16, 2014
    Publication date: July 17, 2014
    Applicant: Renesas Electronics Europe Limited
    Inventors: Riccardo VINCELLI, Agostino CEFALO, Claudio TONGIANI