Patents by Inventor Richard A. Deken

Richard A. Deken has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Compensation and calibration for MEMS devices
    Patent number: 9834438
    Abstract: A sensor system includes a microelectromechanical systems (MEMS) sensor, processing circuitry, measurement circuitry, stimulus circuitry and memory. The system is configured to provide an output responsive to physical displacement within the MEMS sensor to the measurement circuitry. The stimulus circuitry is configured to provide a stimulus signal to the MEMS sensor to cause a physical displacement within the MEMS sensor. The measurement circuitry is configured to process the output from the MEMS sensor and provide it to the processing circuitry, which is configured to generate stimulus signals and provide them to the stimulus circuitry for provision to the MEMS sensor. Output from the measurement circuitry corresponding to the physical displacement occurring in the MEMS sensor is monitored and used to calculate MEMS sensor characteristics. Methods for monitoring and calibrating MEMS sensors are also provided.
    Type: Grant
    Filed: November 20, 2015
    Date of Patent: December 5, 2017
    Assignee: NXP USA, INC.
    Inventors: Tehmoor M. Dar, Bruno J. Debeurre, Raimondo P. Sessego, Richard A. Deken, Aaron A. Geisberger, Krithivasan Suryanarayanan
  • COMPENSATION AND CALIBRATION FOR MEMS DEVICES
    Publication number: 20160167961
    Abstract: A sensor system includes a microelectromechanical systems (MEMS) sensor, processing circuitry, measurement circuitry, stimulus circuitry and memory. The system is configured to provide an output responsive to physical displacement within the MEMS sensor to the measurement circuitry. The stimulus circuitry is configured to provide a stimulus signal to the MEMS sensor to cause a physical displacement within the MEMS sensor. The measurement circuitry is configured to process the output from the MEMS sensor and provide it to the processing circuitry, which is configured to generate stimulus signals and provide them to the stimulus circuitry for provision to the MEMS sensor. Output from the measurement circuitry corresponding to the physical displacement occurring in the MEMS sensor is monitored and used to calculate MEMS sensor characteristics. Methods for monitoring and calibrating MEMS sensors are also provided.
    Type: Application
    Filed: November 20, 2015
    Publication date: June 16, 2016
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Tehmoor M. Dar, Bruno J. Debeurre, Raimondo P. Sessego, Richard A. Deken, Aaron A. Geisberger, Krithivasan Suryanarayanan
  • Compensation and calibration for MEMS devices
    Patent number: 9221679
    Abstract: A sensor system includes a microelectromechanical systems (MEMS) sensor, processing circuitry, measurement circuitry, stimulus circuitry and memory. The system is configured to provide an output responsive to physical displacement within the MEMS sensor to the measurement circuitry. The stimulus circuitry is configured to provide a stimulus signal to the MEMS sensor to cause a physical displacement within the MEMS sensor. The measurement circuitry is configured to process the output from the MEMS sensor and provide it to the processing circuitry, which is configured to generate stimulus signals and provide them to the stimulus circuitry for provision to the MEMS sensor. Output from the measurement circuitry corresponding to the physical displacement occurring in the MEMS sensor is monitored and used to calculate MEMS sensor characteristics. Methods for monitoring and calibrating MEMS sensors are also provided.
    Type: Grant
    Filed: January 22, 2014
    Date of Patent: December 29, 2015
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Tehmoor M. Dar, Bruno J. Debeurre, Raimondo P. Sessego, Richard A. Deken, Aaron A. Geisberger, Krithivasan Suryanarayanan
  • COMPENSATION AND CALIBRATION FOR MEMS DEVICES
    Publication number: 20140260508
    Abstract: A sensor system includes a microelectromechanical systems (MEMS) sensor, processing circuitry, measurement circuitry, stimulus circuitry and memory. The system is configured to provide an output responsive to physical displacement within the MEMS sensor to the measurement circuitry. The stimulus circuitry is configured to provide a stimulus signal to the MEMS sensor to cause a physical displacement within the MEMS sensor. The measurement circuitry is configured to process the output from the MEMS sensor and provide it to the processing circuitry, which is configured to generate stimulus signals and provide them to the stimulus circuitry for provision to the MEMS sensor. Output from the measurement circuitry corresponding to the physical displacement occurring in the MEMS sensor is monitored and used to calculate MEMS sensor characteristics. Methods for monitoring and calibrating MEMS sensors are also provided.
    Type: Application
    Filed: January 22, 2014
    Publication date: September 18, 2014
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Tehmoor M. Dar, Bruno J. Debeurre, Raimondo P. Sessego, Richard A. Deken, Aaron A. Geisberger, Krithivasan Suryanarayanan
  • Digital bandgap reference and method for producing reference signal
    Patent number: 7579860
    Abstract: A system and method (400) for producing a reference signal is provided. The method includes supplying (405) a first current to a diode, sampling (410) a first voltage across the diode, supplying (405) a second current to the diode, sampling (410) a second voltage across the diode, converting (415) the first voltage and the second voltage to a first digital value and a second digital value, and determining (420) a digital reference value from the first digital value and the second digital value. The first voltage is based on the first current, and the second voltage is based on the second current.
    Type: Grant
    Filed: November 2, 2006
    Date of Patent: August 25, 2009
    Assignee: Freescale Semiconductor, Inc.
    Inventor: Richard Deken
  • Digital bandgap reference and method for producing reference signal
    Publication number: 20080122669
    Abstract: A system and method (400) for producing a reference signal is provided. The method includes supplying (405) a first current to a diode, sampling (410) a first voltage across the diode, supplying (405) a second current to the diode, sampling (410) a second voltage across the diode, converting (415) the first voltage and the second voltage to a first digital value and a second digital value, and determining (420) a digital reference value from the first digital value and the second digital value. The first voltage is based on the first current, and the second voltage is based on the second current.
    Type: Application
    Filed: November 2, 2006
    Publication date: May 29, 2008
    Inventor: Richard Deken