Patents by Inventor Richard Arinero

Richard Arinero has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement of radiations of high influence by a capacitive element of MOS type
    Patent number: 8981308
    Abstract: A method for measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element provided with an electrode made from a semiconductor material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects from the measurement of capacitance of the capacitive element in the accumulation regime.
    Type: Grant
    Filed: January 31, 2012
    Date of Patent: March 17, 2015
    Assignee: Universite Montpellier 2 Sciences et Techniques
    Inventors: Richard Arinero, Julien Mekki, Antoine Touboul, Frederic Saigne, Jean-Roch Vaille
  • MEASUREMENT OF RADIATIONS OF HIGH INFLUENCE BY A CAPACITIVE ELEMENT OF MOS TYPE
    Publication number: 20140034841
    Abstract: A method for measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element provided with an electrode made from a semiconductor material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects from the measurement of capacitance of the capacitive element in the accumulation regime.
    Type: Application
    Filed: January 31, 2012
    Publication date: February 6, 2014
    Applicant: UNIVERSITE MONTPELLIER 2 SCIENCES ET TECHNIQUES
    Inventors: Richard Arinero, Julien Mekki, Antoine Touboul, Frederic Saigne, Jean-Roch Vaille
  • Higher harmonics atomic force microscope
    Patent number: 8234913
    Abstract: The invention concerns a microscopic system with atomic force, comprising a probe tip placed on one end of a lever arm (2), oscillating means (1) adapted to oscillate said probe tip substantially based on the fundamental frequency of said lever arm, said system including control means (7) for controlling said oscillating means to vary the oscillation frequency of said tip based on a plurality of harmonics of said lever arm. The invention is characterized in that said control means comprise an input receiving a parameter representing an operating threshold of said system, to vary the oscillation frequency of said tip based on at least one harmonic of said lever arm when said signal corresponds to a state of said system higher than said operating threshold.
    Type: Grant
    Filed: June 21, 2006
    Date of Patent: August 7, 2012
    Assignees: Centre National de la Recherche Scientifique—CNRS, Universite de Montpellier II
    Inventors: Paul Girard, Michel Ramonda, Richard Arinero
  • Higher Harmonics Atomic Force Microscope
    Publication number: 20080223120
    Abstract: The invention concerns a microscopic system with atomic force, comprising a probe tip placed on one end of a lever arm (2), oscillating means (1) a to oscillate said probe tip substantially based on the fundamental frequency of said lever arm, said system including control means (7) for controlling said oscillating mean to vary the oscillation frequency of said tip based on a plurality of harmonics of said lever arm. The invention is characterized in that said control means comprise an input receiving a parameter representing an operating threshold of said system, to vary the oscillation frequency of said tip based on at least one harmonic of said lever arm when said signal corresponds to a state of said system higher than said operating threshold.
    Type: Application
    Filed: June 21, 2006
    Publication date: September 18, 2008
    Inventors: Paul Girard, Michel Ramonda, Richard Arinero