Abstract: Some embodiments include a system, comprising a hybrid imaging device comprising: a first scintillator; a first detector sensors configured to generate a signal based on photons emitted from the first scintillator; a second scintillator; a second detector sensors configured to generate a signal based on photons emitted from the second scintillator; and a control logic coupled to the first detector layer and the second detector layer; wherein: a material of the first scintillator is different from a material of the second scintillator; the first detector overlaps the second detector; and the control logic is configured to generate dose data in response to the first detector and image data in response to the second detector.

Abstract: An imaging apparatus includes a first X-ray detector that includes: a low energy scintillator operable to convert an incident X-ray spectrum into a first set of light photons; a first light imaging sensor operable to generate a set of low energy image signals from the first set of light photons, wherein a first exit radiation is a remainder portion of the first incident radiation after the X-ray spectrum passes through the low energy scintillator and the first light imaging sensor; an energy-separation filter operable to absorb or reflect at least a portion of the energy of the first exit X-ray spectrum and convert the first exit X-ray spectrum into a second exit X-ray spectrum; a second X-ray detector that includes: a high energy scintillator operable to convert the second exit X-ray spectrum into a second set of light photons; a second light imaging sensor operable to generate a set of high energy image signals from the second set of light photons; and a processor configured to: generate a high-energy image

Abstract: Some embodiments include a system, comprising a hybrid imaging device comprising: a first scintillator; a first detector sensors configured to generate a signal based on photons emitted from the first scintillator; a second scintillator; a second detector sensors configured to generate a signal based on photons emitted from the second scintillator; and a control logic coupled to the first detector layer and the second detector layer; wherein: a material of the first scintillator is different from a material of the second scintillator; the first detector overlaps the second detector; and the control logic is configured to generate dose data in response to the first detector and image data in response to the second detector.

Abstract: An imaging apparatus includes a first X-ray detector that includes: a low energy scintillator operable to convert an incident X-ray spectrum into a first set of light photons; a first light imaging sensor operable to generate a set of low energy image signals from the first set of light photons, wherein a first exit radiation is a remainder portion of the first incident radiation after the X-ray spectrum passes through the low energy scintillator and the first light imaging sensor; an energy-separation filter operable to absorb or reflect at least a portion of the energy of the first exit X-ray spectrum and convert the first exit X-ray spectrum into a second exit X-ray spectrum; a second X-ray detector that includes: a high energy scintillator operable to convert the second exit X-ray spectrum into a second set of light photons; a second light imaging sensor operable to generate a set of high energy image signals from the second set of light photons; and a processor configured to: generate a high-energy image

Abstract: A sensor array including sensor pixels is disclosed. A sensor pixel includes a detector and a readout circuit operatively coupled to the detector. The readout circuit includes at least one readout element formed from an amorphous metal oxide alloy semiconductor. Also disclosed is an image detector panel including a sensor array with sensor pixels arranged into rows and columns. The image detector panel includes a gate driver module configured to address rows of the sensor array, and a multiplexing module configured to select columns of the sensor array and multiplex signals from the sensor pixels. The gate driver module and the multiplexing module include elements formed from an amorphous metal oxide alloy semiconductor.

Abstract: Certain embodiments of the present invention provide a system for an electromagnetic shield assembly for use with C-arms. In an embodiment, the system may include a ring shield configured to encompass an x-ray detector. The ring shield may have a first window opening to receive x-rays. The system may also include a window shield configured to shield the first window opening of the ring shield. Certain embodiments of the present invention may provide a system for a universal navigation target. In an embodiment, the system may include a radiolucent calibration target and an electromagnetic shield. The electromagnetic shield may include a ring shield having a first window opening to receive x-rays and a window shield configured to shield the first window opening of the ring shield.

Abstract: The present invention generally relates to a method for forming a flat panel for an X-ray detector device. The method comprises forming an active area of a first size on a substrate of a second size and extending at least one contact of the active area. The method further comprises trimming the substrate to the first size forming the flat panel.

Abstract: A method and system for detecting the potential of an x-ray imaging system to create images with scintillator hysteresis artifacts includes examining an x-ray image to measure two signal levels for two areas of interest, then determining a difference between the two signal levels and comparing the difference to a threshold. The signal levels can be measured by determining an amount of electrical charge discharged in photodiodes of the detector. If the difference in signals is greater than the threshold amount, then the possibility exists that scintillator hysteresis artifacts may be produced in images. In addition, the present invention also provides for the elimination or reduction in magnitude of scintillator hysteresis artifacts in images produced by an x-ray imaging system. After the possibility of scintillator hysteresis artifacts is detected, the detector can be irradiated with an x-ray flux to eliminate or reduce the magnitude of the artifacts in images produced by the x-ray imaging system.

Abstract: Certain embodiments of the present invention provide a system for an electromagnetic shield assembly for use with C-arms. In an embodiment, the system may include a ring shield configured to encompass an x-ray detector. The ring shield may have a first window opening to receive x-rays. The system may also include a window shield configured to shield the first window opening of the ring shield. Certain embodiments of the present invention may provide a system for a universal navigation target. In an embodiment, the system may include a radiolucent calibration target and an electromagnetic shield. The electromagnetic shield may include a ring shield having a first window opening to receive x-rays and a window shield configured to shield the first window opening of the ring shield.

Abstract: The present invention is a directed to a cover assembly for an x-ray detector that incorporates impact-absorbing material designed to absorb the shock, vibration, stress, and strain placed on the detector when dropped or subjected to a load. The cover assembly may include a layer or inserts of impact-absorbing material. Bumpers of impact-absorbing material may also be secured to the x-ray detector cover. Viscoelastic foam or other plastics may be used as the impact-absorbing material.

Abstract: Systems, methods and apparatus are provided through which in some embodiments the line time of an X-Ray detector is dynamically selected so as to nullify an aliased interference signal. The frequency of a noise signal generated by a source external to the digital X-ray detector is determined and, based on the determined frequency, the line time of the digital X-ray is adjusted so as to compensate for the interfering noise. The frequency of the noise can be directly determined from an electromagnetic interference (EMI) sensor or derived through analysis of the power spectrum of the noise signal.

Abstract: The present invention generally relates to a method for forming a flat panel for an X-ray detector device. The method comprises forming an active area of a first size on a substrate of a second size and extending at least one contact of the active area. The method further comprises trimming the substrate to the first size forming the flat panel.

Abstract: Systems, processes and apparatus are described through which non-destructive imaging is achieved, including a process for variable binning of detector elements. The process includes accepting input data indicative of image quality goals and descriptors of an imaging task, as well as parameters characterizing a test subject, relative to non-destructive imaging of an internal portion of the test subject and determining when the non-destructive imaging system is capable of achieving the image quality goals using binning of more than four pixels.

Abstract: Systems, processes and apparatus are described through which non-destructive imaging is achieved, including a process for variable binning of detector elements. The process includes accepting input data indicative of image quality goals and descriptors of an imaging task, as well as parameters characterizing a test subject, relative to non-destructive imaging of an internal portion of the test subject and determining when the non-destructive imaging system is capable of achieving the image quality goals using binning of more than four pixels.

Abstract: The present invention is a directed to a cover assembly for an x-ray detector that incorporates impact-absorbing material designed to absorb the shock, vibration, stress, and strain placed on the detector when dropped or subjected to a load. The cover assembly may include a layer or inserts of impact-absorbing material. Bumpers of impact-absorbing material may also be secured to the x-ray detector cover. Viscoelastic foam or other plastics may be used as the impact-absorbing material.

Abstract: The present invention relates to a method for forming an active area or flat panel in an X-ray detector device. The method comprises forming at least one flat form factor panel in a first size on a substrate of a second size and extending at least one contact of the at least one flat form factor panel. The method further comprises trimming the substrate to the first size forming the at least one flat panel.

Abstract: The present invention is a directed to a cover assembly for an x-ray detector that incorporates impact-absorbing material designed to absorb the shock, vibration, stress, and strain placed on the detector when dropped or subjected to a load. The cover assembly may include a layer or inserts of impact-absorbing material. Bumpers of impact-absorbing material may also be secured to the x-ray detector cover. Viscoelastic foam or other plastics may be used as the impact-absorbing material.

Abstract: Spatially patterned light-blocking layers for radiation imaging detectors are described. Embodiments comprise spatially patterned light-blocking layers for an amorphous silicon flat panel x-ray detector, wherein the spatially patterned light-blocking layer blocks light from a predetermined number of switching elements in the detector, wherein the predetermined number comprises less than all of the switching elements in the detector. These light-blocking layers may block light from each switching element in a predetermined arrangement of switching elements that are read out last, or in any other suitable pattern.

Abstract: A detector imaging system having an apparatus and method for correcting defective pixels in an acquired image is disclosed herein. The system includes a correction scheme including temporarily replacing a defective pixel with a linear interpolation of the defective pixel's surrounding neighboring pixel values, determining a local gradient based in part on the acquired image and a gradient kernel, and providing a correction value based on the local gradient to correct the defective pixel. The correction scheme is repeated a plurality of times as desired to correct all the defective pixels in the acquired image.

Abstract: The present invention is a directed to a cover assembly for an x-ray detector that incorporates impact-absorbing material designed to absorb the shock, vibration, stress, and strain placed on the detector when dropped or subjected to a load. The cover assembly may include a layer or inserts of impact-absorbing material. Bumpers of impact-absorbing material may also be secured to the x-ray detector cover. Viscoelastic foam or other plastics may be used as the impact-absorbing material.