Abstract: A system including a charge source and at least one voltage measurement device is disclosed. The charge source is for generating a charging environment to produce at least one of a voltage profile and a current on an area of dielectric material disposed over a conductive substrate. The area of dielectric material includes a first area containing a subsurface defect. The area of dielectric material also includes a second area that is defect-free. The at least one voltage measurement device is for outputting voltage measurements at different positions over the area of dielectric material. The voltage measurements over the first area differ from voltage measurements over the second area to define a voltage differential.

Abstract: Computer-implemented systems and methods for detecting ESD on a surface and determining an origination location of the ESD. A programmed computer device monitors time-varying current data related to the surface to detect ESD on the surface. The current profile for the surface may be compared to a catalog of ESD current profiles, where each ESD current profile in the catalog corresponds to a different location on the surface. The location on the surface whose corresponding ESD current profile best matches the actual current profile from the ESD may be determined to be the origination location of the ESD. Moderately different processes may be used to determine the ESD origination location depending on whether the surface is symmetrical or irregular, flat or curved, etc.

Abstract: Computer-implemented systems and methods for detecting ESD on a surface and determining an origination location of the ESD. A programmed computer device monitors time-varying current data related to the surface to detect ESD on the surface. The current profile for the surface may be compared to a catalog of ESD current profiles, where each ESD current profile in the catalog corresponds to a different location on the surface. The location on the surface whose corresponding ESD current profile best matches the actual current profile from the ESD may be determined to be the origination location of the ESD. Moderately different processes may be used to determine the ESD origination location depending on whether the surface is symmetrical or irregular, flat or curved, etc.

Abstract: A system including a charge source and at least one voltage measurement device is disclosed. The charge source is for generating a charging environment to produce at least one of a voltage profile and a current on an area of dielectric material disposed over a conductive substrate. The area of dielectric material includes a first area containing a subsurface defect. The area of dielectric material also includes a second area that is defect-free. The at least one voltage measurement device is for outputting voltage measurements at different positions over the area of dielectric material. The voltage measurements over the first area differ from voltage measurements over the second area to define a voltage differential.

Abstract: Disclosed is a lightning attractor apparatus for protecting secondary structures within the lightning protection zone of said lightning attractor apparatus, which is electrically grounded to the body of earth and ground water having reference potential. The apparatus includes a central conductive rod, one or more coaxial cylindrical conductors of decreasing height with the lowest cylindrical conductor on the outside, and a conducting base means onto which all above-ground conductors are rigidly mounted, and which provides the link with a common grounding rod. The grounding rod provides the electrical connection of the apparatus with the reference ground potential. Insulative concentric spacers, located at more or less regular intervals along the axis, separate and isolate the above-ground conductors from one another, their separation being such that arc-over between adjacent conductors are effectively suppressed.