Abstract: Systems and methods are disclosed for testing a device under test (DUT) by receiving a test pattern for a functional test, wherein the test pattern includes a test vector, an expected test result, and an expected power consumption; instructing the test system to run a repetitive loop using a selected functional test as the stimulus; at selected steps in the functional test, measuring power consumption of the DUT; and validating the DUT based on validating the test vector and the power consumption with one or more expected test result patterns and expected power consumption patterns.

Abstract: A vertically sliding frame mounting system that includes a frame, frame mounted first and second bracket assemblies, wall mounted first and second brace assemblies having recoil springs and self releasing latches. The bracket assemblies slide in the brace assemblies which act as vertical guides while the recoil springs tend to lift the frame. The latch assemblies secure the frame in a lowered position while the recoil springs bias the frame upward.