Abstract: Various systems and methods for imprinting a unique identifier on a semiconductor die are disclosed herein. Example embodiments involve receiving a substrate at a photolithography station, the substrate including a photosensitive layer and an area for forming semiconductor dies, forming circuits on the substrate using a photolithography mask, imprinting a unique identifier on each semiconductor die on the substrate using a digital photomask and removing the substrate containing the semiconductor dies containing the circuits and the unique identifiers from the photolithography station. In some embodiments, each unique identifier is associated with a unique record for recording characteristics of the substrate, of the semiconductor die and of the unique identifier. In some embodiments, the digital photomask includes dynamically-controlled pixels, controllable to define a unique pattern for each unique identifier. In some embodiments, the unique identifier is a two-dimensional code.

Abstract: The present invention relates to a method of mitigating conflicts for an operational application implemented by an embedded platform. This method comprising the following steps: constructing at least one first sensitive application configured to be conflicted by the operational application or at least one template application configured to impose conflicts on the operational application; the embedded platform executing the operational application in parallel with the first sensitive application or the template application; determining conflicts generated on the first sensitive application by the operational application or, respectively, on the operational application by the template application; measuring the determined conflicts.