Abstract: The surface profile measuring device of the present invention comprises first and second elongated frame members, each having opposite forward and rearward ends. The frame members are pivotally connected at their adjacent ends by a hinge so as to be longitudinally aligned in an end-to-end relationship and so as to be pivotal about a transverse horizontal axis. The frame members are supported by wheels adjacent the opposite ends of the device and by a mid-wheel adjacent the pivotal connection of the two frame members. As the device travels over a surface to be measured, any irregularities in the surface cause the mid-wheel to be vertically displaced such that the frame members pivot with respect to one another. Vertical displacement of the mid-wheel is continuously and accurately recorded so as to produce a profile of the surface.

Abstract: The surface profile measuring device of the present invention comprises first and second elongated frame members, each having opposite forward and rearward ends. The frame members are pivotally connected at their adjacent ends by hinge so as to be longitudinally aligned in an end-to-end relationship and so as to be pivotal about a transverse horizontal axis. The frame members are supported by wheels adjacent the opposite ends of the device and by a mid-wheel adjacent the pivotal connection of the two frame members. A frame extension rod is rigidly secured to the first frame member and extends rearwardly therefrom. The extension rod terminates in an actuator end having a curved surface. A lever arm is pivotally mounted to the second frame member and has a forward end with a curved surface engaging the curved surface of the extension rod.