Patents by Inventor Richard D. Slates

Richard D. Slates has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Digital eddy current proximity system: apparatus and method
    Patent number: 6664782
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Grant
    Filed: January 8, 2002
    Date of Patent: December 16, 2003
    Assignee: Bently Nevada, LLC
    Inventor: Richard D. Slates
  • Determining a dynamic gaps between a proximity probe and a conductive target material
    Publication number: 20030222639
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 27, 2003
    Publication date: December 4, 2003
    Inventor: Richard D. Slates
  • Digital eddy current proximity system: apparatus and method
    Publication number: 20030214283
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 30, 2003
    Publication date: November 20, 2003
    Inventor: Richard D. Slates
  • Method for measuring a gap between a proximity probe and a conductive target material
    Publication number: 20030214282
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 30, 2003
    Publication date: November 20, 2003
    Inventor: Richard D. Slates
  • Method for measuring a gap between a proximity probe and a conductive target material
    Publication number: 20030210039
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 30, 2003
    Publication date: November 13, 2003
    Inventor: Richard D. Slates
  • Method for measuring a gap between a proximity probe and a conductive target material
    Publication number: 20030210037
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 29, 2003
    Publication date: November 13, 2003
    Inventor: Richard D. Slates
  • Device for digitally measuring electrical impedance
    Publication number: 20030210036
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 27, 2003
    Publication date: November 13, 2003
    Inventor: Richard D. Slates
  • Digital eddy current proximity system: apparatus and method
    Publication number: 20030210038
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 29, 2003
    Publication date: November 13, 2003
    Inventor: Richard D. Slates
  • Method for measuring a gap between a proximity probe and a conductive target material
    Publication number: 20030206002
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibrations method, an automatic material identification and calibration method, a material insensitive method, an inductive-ratio method and advanced-sensing characteristics.
    Type: Application
    Filed: May 29, 2003
    Publication date: November 6, 2003
    Inventor: Richard D. Slates
  • Method for measuring a gap between a proximity probe and a conductive target material
    Publication number: 20030206006
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 30, 2003
    Publication date: November 6, 2003
    Inventor: Richard D. Slates
  • Method for measuring a gap between a proximity probe and a conductive target material
    Publication number: 20030206003
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position Of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: June 3, 2003
    Publication date: November 6, 2003
    Inventor: Richard D. Slates
  • Method for measuring a gap between a proximity probe and a conductive target material
    Publication number: 20030206000
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 29, 2003
    Publication date: November 6, 2003
    Inventor: Richard D. Slates
  • Method for measuring a position of a conductive target material
    Publication number: 20030206001
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 29, 2003
    Publication date: November 6, 2003
    Inventor: Richard D. Slates
  • Digital eddy current proximity system: apparatus and method
    Publication number: 20030206004
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 30, 2003
    Publication date: November 6, 2003
    Inventor: Richard D. Slates
  • Apparatus for determining a gap between a proximity probe component and a conductive target material
    Publication number: 20030206005
    Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
    Type: Application
    Filed: May 30, 2003
    Publication date: November 6, 2003
    Inventor: Richard D. Slates