Abstract: The measuring assembly for analyzing electromagnetic radiation comprises the following structural groups arranged one behind the other in the beam path:at least one linear polarizer (2);at least one optically active element (3) of known optical activity, i.e. known frequency response of the rotation of the polarization plane; andat least one analyzer (4) the polarization direction of which has a fixedly set orientation with respect to the direction of transmission of the linear polarizer. The beam issuing from the analyzer (4) is passed through a photosensitive sensor (7,8) to a measuring circuit. The total intensity of the radiation under investigation is determined in various ways by forming a reference signal, namely by direct measurement with the optically active element temporarily removed from the beam path, by neutralizing a partial beam, or by a beam splitting analyzer.

Abstract: Multibeam measuring device for the real time polarimetric analysis of samples (6), wherein a linearly polarized measuring beam (M) is separated after having traversed the sample (6) by means of a first separation blade (8), preferably a diffraction unit, into a reference beam (R) and at least one test beam (P). Photodiodes (10, 12) record the intensities of both partial beams between which a certain ratio is established, an analyzer (14) with fixed throughpass direction being inserted downstream of a photodiode (12). The intensity value of the test beam (P) which is standardized by the formation of the ratio as a function of the intensity of the reference beam (R) is inputted into a digital data processing unit (24). For the ratio formation, an analog-digital converter (22) is used and provided downstream of the digital data processing unit (24).

Abstract: A device for measuring the rotation of the plane of vibration of linearly polarized electromagnetic radiation includes a beam splitter that divides the radiation into beams following a measurement beam path and a reference beam path, and each of the beam paths are analyzed after interaction with a reference element and a sample to be measured. The beams impinge upon photosensitive sensors and the output signal from such sensors is processed to determine the characteristics of the sample that are desired to be analyzed.