Abstract: A first image including a projection of a portion is generated based on data representing attenuation of higher-energy radiation having a peak energy of at least 1 MeV that passes through a portion of an inspection volume. A second image including a projection of the portion is generated based on data representing attenuation of lower-energy radiation passing through the portion of the inspection volume. A dual-pixel image is created from the first image and the second image. A region of interest is selected from the dual-pixel image. A first basis function that is derived from an attenuation characteristic associated with the region of interest is selected. The region of interest is represented in terms of an amplitude associated with the first basis function and an amplitude associated with the second basis function.

Abstract: An inspection system that forms material sensitive X-ray images of items under inspection. The images are decomposed into basis function images using basis functions representative of materials of interest. The decomposed images may be processed separately to detect concentrations of a material of interest corresponding to one or more of the basis functions. When operated in this mode, the inspection system may be used in applications such as material sorting or security screening. At least one basis function is selected to distinguish a material of interest from other materials likely contained with the item, allowing one of the basis function images to be analyzed to obtain information about a specific material of interest. The images may be automatically analyzed or may be superimposed for display with different visual characteristics assigned to the components associated with each basis function for analysis by a human operator.

Abstract: A first image including a projection of a portion is generated based on data representing attenuation of higher-energy radiation having a peak energy of at least 1 MeV that passes through a portion of an inspection volume. A second image including a projection of the portion is generated based on data representing attenuation of lower-energy radiation passing through the portion of the inspection volume. A dual-pixel image is created from the first image and the second image. A region of interest is selected from the dual-pixel image. A first basis function that is derived from an attenuation characteristic associated with the region of interest is selected. The region of interest is represented in terms of an amplitude associated with the first basis function and an amplitude associated with the second basis function.

Abstract: A representation of an amount of energy incident on a radiation sensor formed from multiple sensing elements coupled together along a direction parallel to a direction of propagation of the incident radiation is received. The radiation sensor has an adjustable border positioned between any two of the multiple sensing elements. From the representation, an amount of energy incident on the radiation sensor is determined. A position of the border is selected based on the amount of energy incident on the radiation sensor. After selecting the position of the border, an absorption characteristic of a region imaged by the radiation sensor is determined.

Abstract: A system may comprise a cathode, a target, one or more switches, and a conductive element. The cathode may be configured and arranged to generate an electron beam, and the target may be configured and arranged to emit radiation when electrons in the electron beam impact the target after being accelerated by an energy source. The one or more switches may be configured and arranged to apply either a first voltage or a second voltage from a power supply between the cathode and the target. The conductive element may be disposed between the cathode and the target so as to inhibit the electron beam generated by the cathode from reaching the target when a signal is applied to the conductive element.

Abstract: A security system for detecting contraband such as explosives. The system has a source of radiation and a detector array. A detector array is made of many small detectors, each with a fast response time. The fast response time allows individual radiation photon interactions with each detector to be counted. By counting the number of interactions in an interval of time, the amount of radiation reaching the detector can be measured. The magnitude of the response from the detector to each radiation interaction allows measurement of the energy level of the photons interacting with the detector. Such a system provides significant flexibility in analyzing data collected from items under inspection. For example, objects such as contraband can be identified within the item under inspection by processing the data to accurately determine both the density and type of material.

Abstract: A contraband detection system using a cone beam computed tomography scanner. The cone beam scanner allows for rapid acquisition of data for computing three dimensional density maps of objects within items under inspection. Where greater resolution is desired, the image information obtained with the cone beam computed tomography scanner may be combined with higher resolution images formed with a single view scanner. A multi-energy single view scanner may be used to additionally provide information on the effective atomic number of objects contained within items under inspection. Additionally, information obtained with the cone beam computed tomography scanner may be used to increase the accuracy of the computation of the effective atomic number of objects within the item under inspection.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information. In another embodiment, a processor analyzes the CT information and the prescan information to determine whether to update the prescan information based on the CT information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information. In another embodiment, a processor analyzes the CT information and the prescan information to determine whether to update the prescan information based on the CT information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a constructed image from the CT scan is performed based on the prescan information. In another embodiment, a processor analyzes the CT information and the prescan information to determine whether to update the prescan information based on the CT information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information.

Abstract: A multiview X-ray based inspection system detects contraband such as explosives, weapons, drugs and money in packages such as baggage. Each bag moves through at least three stationary, fan-shaped beams of x-rays that are in parallel planes spaced from each other in the direction of bag travel, to produce three projection views of the bag taken from different angles. These projection views are processed to extract two-dimensional outlines of likely individual objects in the bag, and the two-dimensional outlines are matched between different projection views to extract three-dimensional outlines of likely objects in the bag. The system uses these three-dimensional outlines to estimate effective atomic numbers and mass densities of material in these objects, and then to determine the presence of likely contraband in the baggage by testing these estimates against windows in a multi-dimensional space in which one dimension is effective atomic number and another is mass density.

Abstract: An X-ray inspection device (10) for detecting a specific material of interest in items of various sizes and shapes (24A, 24B, 24C) includes an X-ray source system located at an inspection region and constructed to expose the examined item to at least one beam of X-ray radiation, and one or more X-ray detection systems (60, 80, 100). The X-ray inspection device also includes one or more dimension detectors (120) constructed to measure a selected dimension of the examined item, an interface system connected to receive X-ray data and dimension data, and a computer programmed to utilize the data for recognition of the specific material of interest and to indicate its presence in the examined item. Each detection system includes one or more arrays of X-ray detectors arranged in a linear, circular or semi-spherical geometry.

Abstract: An X-ray inspection device for detecting a specific material of interest (typically contraband, for example, weapons, drugs, money, explosives) in items of various sizes and shapes includes an X-ray source system located at an inspection region and constructed to expose the examined item to at least one beam of X-ray radiation, one or more x-ray detection systems located at the inspection region and constructed to detect x-ray radiation modified by the examined item. The X-ray inspection device also includes one or more dimension detectors constructed to measure a selected dimension of the examined item, an interface system connected to receive X-ray data and dimension data, and a computer programmed to utilize the data for recognition of the specific material of interest and to indicate its presence in the examined item. The X-ray detection systems detect transmitted and/or scattered X-ray radiation utilizing several different geometries.