Abstract: The present invention is a method and apparatus for detecting a target species. The target molecule may be in liquid phase (in solution) or (for some embodiments of the invention) in vapor phase. A sensor according to the present invention monitors whether a target species has selectively bound to groups on the cantilever surface by monitoring the displacement of the cantilever, and hence the force acting on the cantilever. This force acting on the cantilever arises from the force acting on a structure that moves in electric or magnetic field, and that may be selectively bound to the cantilever. In the case of target species having a sufficiently large net electric charge or dipole moment, the target species itself may serve as the structure that moves in an electric field.

Abstract: The magnetic sensor of this invention is characterized by a magnet suspen on a torsion bar or wire and by a tunneling tip separated from one end of the magnet, a gap between the tip and the magnet that is small enough to support a tunneling current, an electrical source for imposing a constant biasing voltage across the gap, an electrical force to maintain the magnet and the tip sufficiently close so that a constant tunneling current is maintained therebetween, a feedback circuit to monitor current changes in the gap that result from rotation of the magnet due to changes in the surrounding magnetic field, and at least one recorder to record changes in the magnetic field.

Abstract: A sensor for ultra-low concentration chemical recognition comprises a force transducer, a tip coupled to this force transducer, and a substrate positioned for force interaction with the force transducer tip, where the substrate and tip are chemically modified with antigens, antibodies, nucleic acids, or chelating agents so that there is a specific force interaction between the tip and the substrate in the presence of the target species, and a measurably different force interaction in the absence of the target species.

Abstract: A method and apparatus to use an Atomic Force Microscope to take measurements of surface forces, indentation, adhesion and mechanical properties such as hardness and elasticity. The force between a probe mounted cantilever and a sample is measured as a function cantilever deflection measured by a electron tunneling microscope. The sample and the tip of the tunneling microscope are each mounted on piezoelectric manipulators which provide for position control. Position of the sample and probe are measured from the voltages applied to the piezoelectric manipulators. Penetration is determined by the relative motion between the probe and sample. Presently, this invention has a force resolution of 1 nN and a depth resolution of 0.02 nm.

Abstract: A tunneling tip piezo is incorporated into various devices for measuring effect of changes in environmental conditions (i.e., temperature, pressure, magnetic and electrical fields, etc) upon a material by sensing minute changes in the dimensions of the surface. The devices may be used to detect changes in environmental conditions or to determine physical properties of a material.