Abstract: A multispectral inspection (MSI) device for analyzing an electronic item having a printed circuit board (PCB). An electronic power supply powers the electronic item in accordance with one or more test vectors. An optical imaging scanner, terahertz (THz) imaging scanner, and a functional imaging scanner are each operative to scan the electronic item. An electronic processor is programmed to scan the various scanners and control the power supply to acquire optical, THz, and functional images of the electronic item. The images are combined to form a standard three-dimensional (3D) signature and artificial intelligence (AI) classifiers are applied to the 3D signature to perform non-destructive analyses of the electronic item.

Abstract: A multispectral inspection (MSI) device for analyzing an electronic item having a printed circuit board (PCB). An electronic power supply powers the electronic item in accordance with one or more test vectors. An optical imaging scanner, terahertz (THz) imaging scanner, and a functional imaging scanner are each operative to scan the electronic item. An electronic processor is programmed to scan the various scanners and control the power supply to acquire optical, THz, and functional images of the electronic item. The images are combined to form a standard three-dimensional (3D) signature and artificial intelligence (AI) classifiers are applied to the 3D signature to perform non-destructive analyses of the electronic item.

Abstract: A multispectral inspection (MSI) device for analyzing an electronic item having a printed circuit board (PCB). An electronic power supply powers the electronic item in accordance with one or more test vectors. An optical imaging scanner, terahertz (THz) imaging scanner, and a functional imaging scanner are each operative to scan the electronic item. An electronic processor is programmed to scan the various scanners and control the power supply to acquire optical, THz, and functional images of the electronic item. The images are combined to form a standard three-dimensional (3D) signature and artificial intelligence (AI) classifiers are applied to the 3D signature to perform non-destructive analyses of the electronic item.

Abstract: Described are a shutter assembly, a spectrometer, and a method for calibrating a spectrometer. For example, the method may include positioning a shutter including a mirror into a first position in an illumination path of an excitation light beam such that a measurement window is blocked. The mirror may be operable to direct at least one of: (1) the illumination path to a spectral calibration material, (2) a first collection path extending from the spectral calibration material, and (3) a second collection path of a spectral calibration light beam. The method may include directing a returned light from the receiving optics unit to an imaging device; processing the returned light at the imaging device into one or more image signals; analyzing and comparing the image signals with approved image signals; and providing an indication of whether the comparative results of the analysis are within acceptable tolerances.

Abstract: Described are a shutter assembly, a spectrometer, and a method for calibrating a spectrometer. For example, the method may include positioning a shutter including a mirror into a first position in an illumination path of an excitation light beam such that a measurement window is blocked. The mirror may be operable to direct at least one of: (1) the illumination path to a spectral calibration material, (2) a first collection path extending from the spectral calibration material, and (3) a second collection path of a spectral calibration light beam. The method may include directing a returned light from the receiving optics unit to an imaging device; processing the returned light at the imaging device into one or more image signals; analyzing and comparing the image signals with approved image signals; and providing an indication of whether the comparative results of the analysis are within acceptable tolerances.

Abstract: Sensors operate by resolving changes in orientation of a wavelength dependent structure with respect to a reference direction determined by an incident light beam, resulting in very high sensitivity and dynamic range. Said sensors are wavelength encoded, can be multiplexed in a single light path such as an optical fiber, yet are decoupled mechanically from the fiber, resulting in high stability.

Abstract: A shutter assembly for use with a spectrometer having at least one source of optical radiation such as at least one laser capable of generating an excitation light beam having an illumination path. The shutter assembly includes a shutter having at least one of (i) at least one calibration material capable of generating a consistent spectrum within wavelengths utilizable by the spectrometer and (ii) a mirror capable of diverting at least one of the illumination path and a collection path relative to a calibration standard capable of generating a consistent spectrum within wavelengths utilizable by the spectrometer. The shutter assembly further includes a mechanism capable of moving the shutter into at least a first position in the path of the light beam and a second position out of the path of the light beam to enable a sample to be analyzed.

Abstract: Sensors operate by resolving changes in orientation of a wavelength dependent structure with respect to a reference direction determined by an incident light beam, resulting in very high sensitivity and dynamic range. Said sensors are wavelength encoded, can be multiplexed in a single light path such as an optical fiber, yet are decoupled mechanically from the fiber, resulting in high stability.

Abstract: Innovative techniques that result in a better signal-to-noise ratio for spectrographic analysis of substances in a target than conventional techniques. In these techniques, light illuminates a target with at least some of the light penetrating the target. At least a portion of the light that penetrates the target is collected from a region on the target's surface that is not directly illuminated. Preferably, at least a majority of the collected light is light that penetrates the target. Also preferably, the light that illuminates the target is in a pattern that partially but not completely surrounds the region from which the portion of the light that penetrates the target is collected. A spectrum of at least a portion of the collected light is analyzed.

Abstract: A process and system for the production of inorganic nanoparticles by precipitating the inorganic nanoparticles by a precipitating agent from a microemulsion with a continuous and a non-continuous phase; and concentrating the precipitated nanoparticles employing an ultrafiltration membrane.