Patents by Inventor Richard J. McCormick

Richard J. McCormick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical apparatus for rapid defect analysis
    Patent number: 5926266
    Abstract: Apparatus for inspecting the surface of a sample includes a wide scanning interferometer, which is used to locate defects, or anomalies in the surface, and a narrow scanning interferometer, which is used to develop profiles of individual defects found by the narrow scanning interferometer. The sample may be driven in rotation about an axis, while the interferometers are independently moved radially to the axis.
    Type: Grant
    Filed: September 23, 1996
    Date of Patent: July 20, 1999
    Assignee: International Business Machines Corporation
    Inventors: Alan D. Dorundo, Michael Gerard Lisanke, Huizong Lu, Richard J. McCormick, Lanphuong Thi Pena, Eric V. Schnetzer, Ali Reza Taheri