Patents by Inventor Richard Jacob Wilcox

Richard Jacob Wilcox has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6897664
    Abstract: Apparatus for and methods of inspection using laser beam induced alteration are provided. In one aspect, an apparatus is provided that includes a laser scanning microscope for directing a laser beam at a circuit structure and a source for biasing and thereby establishing a power condition in the circuit structure. A detection circuit is provided for detecting a change in the power condition in response to illumination of the circuit structure by the laser beam and generating a first output signal based on the detected change. A signal processor is provided for processing the first output signal and generating a second output signal based thereon. A control system is operable to scan the laser beam according to a pattern that has a plurality of pixel locations, whereby the laser beam may be moved to a given pixel location and allowed to dwell there for a selected time before being moved to another pixel location.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: May 24, 2005
    Assignees: Advanced Micro Devices, Inc., Semicaps Pte Ltd.
    Inventors: Michael Bruce, Gregory A. Dabney, Palaniappan Muthupalaniappan, Jiann Min Chin, Richard Jacob Wilcox, Glen Gilfeather, Brennan Davis, Jacob Phang, Choon Meng Chua, Lian Ser Koh, Hoo-Yin Ng, Soon Huat Tan
  • Patent number: 6771089
    Abstract: A test fixture having an adjustable capacitance (10) and a method for testing a semiconductor component using the test fixture (10). The test fixture (10) includes a loadboard (12) having a semiconductor component receiving area (14), and a power supply input terminal (16) capable of receiving an unbuffered constant current bias signal from a power supply (18). A semiconductor component is coupled to the semiconductor component receiving area (14). A switched capacitor network (21) mounted on the test fixture (10) is configured so that a desired load capacitance is coupled to the power supply input terminal (16) when the semiconductor component is initialized. Then the switched capacitor network (21) is configured so that substantially zero capacitance is coupled to the power supply input terminal. Power supply voltage fluctuations are mapped while the semiconductor component is biased with the power supply and receiving a voltage alteration signal from a laser.
    Type: Grant
    Filed: May 29, 2002
    Date of Patent: August 3, 2004
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Richard Jacob Wilcox
  • Patent number: 6546513
    Abstract: A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT).
    Type: Grant
    Filed: June 2, 2000
    Date of Patent: April 8, 2003
    Assignee: Advanced Micro Devices
    Inventors: Richard Jacob Wilcox, Jason D. Mulig, David Eppes, Michael R. Bruce, Victoria J. Bruce, Rosalinda M. Ring, Edward I. Cole, Jr., Paiboon Tangyunyong, Charles F. Hawkins, Arnold Y. Louie