Abstract: A model eye includes an optically transmissive structure having a front curved surface to receive a coherent light beam, and an opposite rear planar surface for directing a portion of the coherent light beam back out the model eye through the front curved surface; and a material structure adhered to the rear planar surface of the optically transmissive structure that has a characteristic to cause a speckle pattern of the portion of the coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2:1. In some embodiments, the material structure may include a fabric-reinforced polyethylene tape adhered to the rear planar surface of the optically transmissive structure by an adhesive. One example material structure which may be employed is duct tape.

Abstract: A model eye includes an optically transmissive structure having a front curved surface to receive a coherent light beam, and an opposite rear planar surface for directing a portion of the coherent light beam back out the model eye through the front curved surface; and a material structure adhered to the rear planar surface of the optically transmissive structure that has a characteristic to cause a speckle pattern of the portion of the coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2:1. In some embodiments, the material structure may include a fabric-reinforced polyethylene tape adhered to the rear planar surface of the optically transmissive structure by an adhesive. One example material structure which may be employed is duct tape.

Abstract: A model eye includes an optically transmissive structure having a front curved surface to receive a coherent light beam, and an opposite rear planar surface for directing a portion of the coherent light beam back out the model eye through the front curved surface; and a material structure adhered to the rear planar surface of the optically transmissive structure that has a characteristic to cause a speckle pattern of the portion of the coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2:1. In some embodiments, the material structure may include a fabric-reinforced polyethylene tape adhered to the rear planar surface of the optically transmissive structure by an adhesive. One example material structure which may be employed is duct tape.

Abstract: A model eye includes an optically transmissive structure having a front curved surface to receive a coherent light beam, and an opposite rear planar surface for directing a portion of the coherent light beam back out the model eye through the front curved surface; and a material structure adhered to the rear planar surface of the optically transmissive structure that has a characteristic to cause a speckle pattern of the portion of the coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2:1. In some embodiments, the material structure may include a fabric-reinforced polyethylene tape adhered to the rear planar surface of the optically transmissive structure by an adhesive. One example material structure which may be employed is duct tape.

Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.

Abstract: Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.

Abstract: An ophthalmic error measurement system includes a projecting optical system delivering light onto a retina of an eye, a pre-correction system which compensates a light beam to be injected into the eye for aberrations in the eye, the pre-correction system being positioned in between the projecting optical system and the eye, an imaging system which collects light scattered by the retina, and a detector receiving light returned by the retina from the imaging system. Use of the pre-correction system allows the end-to-end aberrations of the ocular system to be analyzed. The use of a pre-correction system also allows use of a minimized spot size on the retina, and all of its attendant advantages.

Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.

Abstract: A system and method of measuring the curvature of a surface of a object operate by illuminating the object surface with a light pattern having a known size to produce a virtual reflected image from the object surface; measuring a size of the virtual reflected image produced by the object surface from the light pattern; and calculating a curvature of the object surface from the known size of the light pattern and the size of the virtual reflected image.

Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.

Abstract: A method and associated system improve accuracy in objective refraction measurements by including the measured distance between the photoreceptors of a subject's eye and the scattering location of light during the objective refraction measurements. Chromatic aberrations in the objective measurements are also compensated. The distance between the photoreceptors and the scattering location may be determined by adjusting a distance between a rotating speckled light pattern and an eye until the speckled light pattern appears to be stationary, or by employing a Scheiner disk.

Abstract: Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.

Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.

Abstract: A real-time refractory control system includes a laser refractive surgery instrument for modifying the refraction of the eye, an objective diagnostic apparatus for measuring the refraction and aberrations of the eye, and an aperture-sharing element to inject a refractive surgery beam and a monitoring diagnostic beam. An associated method of adjusting a refraction of an eye, includes: performing a procedure to modify the refraction of the eye; while the procedure is being performed, measuring the refraction and/or an aberration of the eye; and terminating the procedure when a change in the measured refraction and/or the measured aberration reaches a desired value.

Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.

Abstract: A method and associated system improve accuracy in objective refraction measurements by including the measured distance between the photoreceptors of a subject's eye and the scattering location of light during the objective refraction measurements. Chromatic aberrations in the objective measurements are also compensated. The distance between the photoreceptors and the scattering location may be determined by adjusting a distance between a rotating speckled light pattern and an eye until the speckled light pattern appears to be stationary, or by employing a Scheiner disk.

Abstract: A real-time refractory control system includes a laser refractive surgery instrument for modifying the refraction of the eye, an objective diagnostic apparatus for measuring the refraction and aberrations of the eye, and an aperture-sharing element to inject a refractive surgery beam and a monitoring diagnostic beam. An associated method of adjusting a refraction of an eye, includes: performing a procedure to modify the refraction of the eye; while the procedure is being performed, measuring the refraction and/or an aberration of the eye; and terminating the procedure when a change in the measured refraction and/or the measured aberration reaches a desired value.