Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for predicting a structure of a protein that comprises a plurality of amino acid chains.

Abstract: An apparatus and method are provided for storing a plurality of translation entries in a cache, each translation entry corresponding to one of a plurality of page table entries and defining a translation between a first address and a second address, and encoding control information indicative of an attribute of each page table entry; returning, in response to a lookup querying a first lookup address, a corresponding second address when the first lookup address corresponds to one of the plurality of translation entries stored in the cache; modifying at least some of the control information in response to notification of a modification of the attribute in a page table entry; and retaining in the cache at least one translation entry corresponding to the page table entry for use in a subsequent address lookup querying a corresponding first lookup address in response to the notification of the modification of the attribute in the page table entry.

Abstract: Aspects of the invention include methods of generating models for scoring patient notes. The methods include receiving a sample of patient notes, extracting a plurality of ngrams from the sample of patient notes, clustering the plurality of extracted ngrams that meet a similarity threshold into a plurality of lists, identifying a feature associated with each of the plurality of lists based on the ngrams in that list and designating at least one ngram in each list as evidence of the feature associated with that list. The identified features and designated ngram are stored in models for scoring patient notes.

Abstract: A system and method for determining the location of a particular device on an integrated circuit chip is described. The system and method utilize apparatus for detecting the emission of light during switching events of devices in the circuit during the circuit's processing of an input calculated to actuate the device whose location is desired. Light emissions from the circuit can be temporally and spatially indexed so as to allow deduction, in combination with the a priori knowledge of the logical operation of the circuit, of the location of the desired element. In another embodiment of the invention, a series of images of the circuit can be accumulated, representing the circuit's response to a series of different input signals, each input signal being designed to result in the switching of the desired element. The series of images can be compared to determine the location of the desired element.

Abstract: A system and method for determining the location of a particular device on an integrated circuit chip is described. The system and method utilize apparatus for detecting the emission of light during switching events of devices in the circuit during the circuit's processing of an input calculated to actuate the device whose location is desired. Light emissions from the circuit can be temporally and spatially indexed so as to allow deduction, in combination with the a priori knowledge of the logical operation of the circuit, of the location of the desired element. In another embodiment of the invention, a series of images of the circuit can be accumulated, representing the circuit's response to a series of different input signals, each input signal being designed to result in the switching of the desired element. The series of images can be compared to determine the location of the desired element.

Abstract: A method for forming a silicon on insulator region on a single crystal silicon substrate, comprising the steps of: forming a first dielectric region in a silicon substrate by etching, deposition, and chemical-mechanical polishing; forming a single crystal layer on the substrate by polysilicon deposition and re-growth or epitaxial growth; removing portions of the single crystal layer to produce silicon islands that are fully on the first dielectric region; and filling in the spaces between the silicon islands with a second dielectric, by deposition and chemical-mechanical-polish, that overlaps peripheral portions of the first dielectric. Additional steps subdivide the fully isolated silicon on insulator regions by etching trenches in the islands and backfilling with a third dielectric, by deposition and chemical-mechanical-polish.

Abstract: A method for forming a silicon on insulator region on a single crystal silicon substrate, comprising the steps of: forming a first dielectric region in a silicon substrate by etching, deposition, and chemical-mechanical polishing; forming a single crystal layer on the substrate by polysilicon deposition and re-growth or epitaxial grownth; removing portions of the single crystal layer to produce silicon islands that are fully on the first dielectric region; and filling in the spaces between the silicon islands with a second dielectric, by deposition and chemical-mechanical-polish, that overlaps peripheral portions of the first dielectric. Additional steps sub-divide the fully isolated silicon on insulator regions by etching trenches in the islands and backfilling with a third dielectric, by deposition and chemical-mechanical-polish.

Abstract: Methods for the ready identification of dynamic defects using switching induced light emission from CMOS gates in complex integrated circuits such as microprocessors are described. The rapid increase in the complexity of logic circuits means that practical gate level identification of the sources of dynamic errors will require methods other than the gate by gate tracing of every possible path taken by a given set of instructions. The methods described here are based on the ability of picosecond imaging circuit analysis to detect the switching activity of every gate of a complex circuit in a single, passive measurement, and the ability of data processing today to compare large two- and three-dimensional files.