Abstract: A system for duplicating a master key includes a clamping mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends. The key blade has an upper surface and a minor key axis along a key thickness. A mechanical measurement device includes a probe that deflects along the intermediate key axis during a measurement process. A movement mechanism imparts relative motion along the major key axis between the mechanical measurement device and the master key. The mechanical probe follows the upper surface of the key blade. The mechanical measurement device generates a signal indicative of the deflection of the probe. A processor receives the signal and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends, and a minor key axis along a key thickness. Optical path components direct a light beam along the minor key axis. The light beam impinges upon the key blade. A portion of the light beam traverses the key blade. A detector receives the portion of the light beam that traverses the key blade. An apparatus imparts relative motion along the major key axis between the light beam and the master key. The light beam scans along the major key axis of the master key. A processor receives a signal from the detector as the beam scans along the major key axis and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a clamping mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends. The key blade has an upper surface and a minor key axis along a key thickness. A mechanical measurement device includes a probe that deflects along the intermediate key axis during a measurement process. A movement mechanism imparts relative motion along the major key axis between the mechanical measurement device and the master key. The mechanical probe follows the upper surface of the key blade. The mechanical measurement device generates a signal indicative of the deflection of the probe. A processor receives the signal and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends, and a minor key axis along a key thickness. Optical path components direct a light beam along the minor key axis. The light beam impinges upon the key blade. A portion of the light beam traverses the key blade. A detector receives the portion of the light beam that traverses the key blade. An apparatus imparts relative motion along the major key axis between the light beam and the master key. The light beam scans along the major key axis of the master key. A processor receives a signal from the detector as the beam scans along the major key axis and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a clamping mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends. The key blade has an upper surface and a minor key axis along a key thickness. A mechanical measurement device includes a probe that deflects along the intermediate key axis during a measurement process. A movement mechanism imparts relative motion along the major key axis between the mechanical measurement device and the master key. The mechanical probe follows the upper surface of the key blade. The mechanical measurement device generates a signal indicative of the deflection of the probe. A processor receives the signal and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends, and a minor key axis along a key thickness. Optical path components direct a light beam along the minor key axis. The light beam impinges upon the key blade. A portion of the light beam traverses the key blade. A detector receives the portion of the light beam that traverses the key blade. An apparatus imparts relative motion along the major key axis between the light beam and the master key. The light beam scans along the major key axis of the master key. A processor receives a signal from the detector as the beam scans along the major key axis and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends, and a minor key axis along a key thickness. Optical path components direct a light beam along the minor key axis. The light beam impinges upon the key blade. A portion of the light beam traverses the key blade. A detector receives the portion of the light beam that traverses the key blade. An apparatus imparts relative motion along the major key axis between the light beam and the master key. The light beam scans along the major key axis of the master key. A processor receives a signal from the detector as the beam scans along the major key axis and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends, and a minor key axis along a key thickness. Optical path components direct a light beam along the minor key axis. The light beam impinges upon the key blade. A portion of the light beam traverses the key blade. A detector receives the portion of the light beam that traverses the key blade. An apparatus imparts relative motion along the major key axis between the light beam and the master key. The light beam scans along the major key axis of the master key. A processor receives a signal from the detector as the beam scans along the major key axis and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a clamping mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends. The key blade has an upper surface and a minor key axis along a key thickness. A mechanical measurement device includes a probe that deflects along the intermediate key axis during a measurement process. A movement mechanism imparts relative motion along the major key axis between the mechanical measurement device and the master key. The mechanical probe follows the upper surface of the key blade. The mechanical measurement device generates a signal indicative of the deflection of the probe. A processor receives the signal and generates information usable for defining the machining of a duplicate key.

Abstract: A system for duplicating a master key includes a mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends, and a minor key axis along a key thickness. Optical path components direct a light beam along the minor key axis. The light beam impinges upon the key blade. A portion of the light beam traverses the key blade. A detector receives the portion of the light beam that traverses the key blade. An apparatus imparts relative motion along the major key axis between the light beam and the master key. The light beam scans along the major key axis of the master key. A processor receives a signal from the detector as the beam scans along the major key axis and generates information usable for defining the machining of a duplicate key.

Abstract: A media handling device is disclosed herein. One embodiment of the media handling device comprises a picker, a support mechanism, and an imaging device. The support mechanism may comprise a first portion and a second portion wherein the first portion is attached to the picker and wherein the second portion is movably associated with the first portion. The support mechanism first portion is slidably attached to the support mechanism second portion. The imaging device attached to the support mechanism second portion. The support mechanism second portion has a first operative position and a second operative position relative to the support mechanism first portion.

Abstract: A media handling device is disclosed herein. One embodiment of the media handling device comprises a picker, a support mechanism, and an imaging device. The support mechanism may comprise a first portion and a second portion wherein the first portion is attached to the picker and wherein the second portion is movably associated with the first portion. The support mechanism first portion is slidably attached to the support mechanism second portion. The imaging device attached to the support mechanism second portion. The support mechanism second portion has a first operative position and a second operative position relative to the support mechanism first portion.

Abstract: An autochanger includes an imaging device affixed to a media handling device. The autochanger is of the type that uses optical indicia to identify media pieces located therein. The imaging device is movable between a first position and a second position relative to the media handling device. The autochanger moves the imaging device to positions relative to the media pieces where the imaging device can read the indicia. The autochanger further moves the imaging device relative to the media handling device to optimize the reading capability of the imaging device without increasing the size of the autochanger.

Abstract: A method and apparatus that allows the adjustment of the intensity of the illumination source in a barcode reader, using the barcode reader as the measuring device, to give a predetermined amount of light from a known target. The adjustment of the intensity of the illumination source in the barcode reader compensates for the manufacturing tolerances of the barcode reader.

Abstract: An autochanger includes an imaging device affixed to a media handling device. The autochanger is of the type that uses optical indicia to identify media pieces located therein. The imaging device is movable between a first position and a second position relative to the media handling device. The autochanger moves the imaging device to positions relative to the media pieces where the imaging device can read the indicia. The autochanger further moves the imaging device relative to the media handling device to optimize the reading capability of the imaging device without increasing the size of the autochanger.

Abstract: Methods and apparatus for quantifying the amount of backlash in drive trains. Using two optical transducers techniques are disclosed that lend themselves to self diagnosis of backlash in drive train systems. The techniques are useful in autochanger drive systems, but are also applicable to all systems involving the driven motion of devices.