Patents by Inventor Richard L. Schupbach

Richard L. Schupbach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Configurable test suite
    Patent number: 8352791
    Abstract: A system and method for testing a control module includes a microprocessor, where the microprocessor has a programming environment. The programming environment has a test data structure, a configuration data structure, and a monitor data structure each containing data. At least one test data instance is associated with the test data structure and at least one configuration data instance is associated with the configuration data structure. The configuration data instance is a diagnostic test that monitors a parameter of the microprocessor, and the monitor data structure creates the test data instance such that each test data instance corresponds to one of the configuration data instances. The program includes a first control logic for associating the test data structure, the configuration data structure and the monitor data structure as part of a core infrastructure portion of the programming environment, where the core infrastructure portion of the program is static.
    Type: Grant
    Filed: June 4, 2010
    Date of Patent: January 8, 2013
    Assignee: GM Global Technology Operations LLC
    Inventors: Onno R. Van Eikema Hommes, Richard L. Schupbach, James K. Thomas
  • CONFIGURABLE TEST SUITE
    Publication number: 20110302472
    Abstract: A system and method for testing a control module includes a microprocessor, where the microprocessor has a programming environment. The programming environment has a test data structure, a configuration data structure, and a monitor data structure each containing data. At least one test data instance is associated with the test data structure and at least one configuration data instance is associated with the configuration data structure. The configuration data instance is a diagnostic test that monitors a parameter of the microprocessor, and the monitor data structure creates the test data instance such that each test data instance corresponds to one of the configuration data instances. The program includes a first control logic for associating the test data structure, the configuration data structure and the monitor data structure as part of a core infrastructure portion of the programming environment, where the core infrastructure portion of the program is static.
    Type: Application
    Filed: June 4, 2010
    Publication date: December 8, 2011
    Applicant: GM GLOBAL TECHNOLOGY OPERATIONS, INC.
    Inventors: Onno R. Van Eikema Hommes, Richard L. Schupbach, James K. Thomas