Abstract: Providing deterministic frequency and voltage enhancements for a processor is disclosed. In an embodiment, a microcontroller on a processor identifies a plurality of parameters related to a processor, the plurality of parameters including at least a current supplied to the processor; determines, in dependence upon the plurality of parameters, one or more frequency scaling indexes including determining an effective switching capacitance ratio; identifies, in dependence upon the one or more frequency scaling indexes, a predetermined frequency parameter for the processor; and transitions, based on the frequency parameter, the processor to a target clock frequency.

Abstract: Providing deterministic frequency and voltage enhancements for a processor is disclosed. In an embodiment, a microcontroller on a processor identifies a plurality of parameters related to a processor, the plurality of parameters including at least a current supplied to the processor; determines, in dependence upon the plurality of parameters, one or more frequency scaling indexes including determining an effective switching capacitance ratio; identifies, in dependence upon the one or more frequency scaling indexes, a predetermined frequency parameter for the processor; and transitions, based on the frequency parameter, the processor to a target clock frequency.

Abstract: Guardband validation for a device having a critical path monitor involves first applying multiple calibration settings to the monitor during functional operation of the processor, and recording corresponding guardbands which result in reduced timing margin. A desired guardband can later be selected for validation. The calibration settings can be based on delays for a critical path. A calibration test procedure can be used to determine the calibration delays for different operating frequencies or voltages that are set or, alternatively, the calibration delays can be set and resultant frequencies measured which are used to calculate the guardband amounts. The critical path monitor may include a modified calibration delay circuit which provides a calibrated delay signal to a critical path synthesis circuit, and the multiple calibration settings can be applied by changing delay taps of the calibration delay circuit in response to a bias delay signal from a power management controller.

Abstract: A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing.

Abstract: A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing.