Patents by Inventor Richard Lakhan

Richard Lakhan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9593930
    Abstract: The present invention provides a probe apparatus and an associated method for measuring a magnetite deposit thickness, which apparatus and method is independent of the porosity and magnetic permeability of the magnetite deposit. The probe apparatus of this invention is an axial scanning and inside surface-following probe that can accurately and reliably measure the inside diameter of a tube. The probe apparatus of the present invention optionally comprises two modules: the first module is the surface-following module and the second module is a conventional eddy current probe.
    Type: Grant
    Filed: June 25, 2010
    Date of Patent: March 14, 2017
    Inventors: Richard Lakhan, Brian Lepine, Joseph Renaud, Laurie Davey
  • Publication number: 20130009634
    Abstract: The present invention provides a probe apparatus and an associated method for measuring a magnetite deposit thickness, which apparatus and method is independent of the porosity and magnetic permeability of the magnetite deposit. The probe apparatus of this invention is an axial scanning and inside surface-following probe that can accurately and reliably measure the inside diameter of a tube. The probe apparatus of the present invention optionally comprises two modules: the first module is the surface-following module and the second module is a conventional eddy current probe.
    Type: Application
    Filed: June 25, 2010
    Publication date: January 10, 2013
    Inventors: Richard Lakhan, Brian Lepine, Joseph Renaud, Laurie Davey