Patents by Inventor Richard Lee Bovey

Richard Lee Bovey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10310929
    Abstract: A system/method of diagnosing combinations of failures in a system includes receiving symptom data (116) including information relating to observed or detected symptoms in a system. The system/method generates (D4a, D4b, D5) failure data (118) including information relating to at least one most probable failures in the system based on the symptom data, and processes (D9) the failure data and the symptom data using an L-best inference (e.g. a Ranked Algorithm (RA)) technique in order to generate failure set data (120), the failure set data including information relating to at least one most probable combination of the failures that explain the symptoms.
    Type: Grant
    Filed: April 22, 2014
    Date of Patent: June 4, 2019
    Assignee: BAE SYSTEMS plc
    Inventors: Richard Lee Bovey, Erdem Turker Senalp
  • Patent number: 9959153
    Abstract: A method of assisting failure diagnosis in a system includes obtaining data including a probabilistic Bayesian Network describing a set of failures, a set of symptoms and probabilities of at least some of the symptoms being associated with at least some of the failures in a system. A cost value representing a cost associated with learning of a presence or absence of the symptom is obtained for at least some of the symptoms, as well as a plurality of information values, e.g. values representing measures of information gained by learning of the presence or absence of the symptom in relation to a respective plurality of the failures, associated with the symptom. The method then computes an information-for-cost value for the symptom based on the cost value and the plurality of information values.
    Type: Grant
    Filed: April 17, 2009
    Date of Patent: May 1, 2018
    Assignee: BAE Systems plc
    Inventor: Richard Lee Bovey
  • Patent number: 9424694
    Abstract: A method of generating probability data for use in assessing performance of a system and a mission involving the system. The method includes receiving (302) a combined model describing a system diagnosis model describing symptoms, failures and link strengths (conditionals) of components/subsystems of the system, and a mission impact model, the mission impact model describing effects of the system on an ability to perform the mission. Observation data regarding a state of the system is also received (306) The observation data is used (308) in combination with the combined model to generate probability data for use in assessing performance of the system and the mission.
    Type: Grant
    Filed: July 10, 2013
    Date of Patent: August 23, 2016
    Assignee: BAE SYSTEMS plc
    Inventors: Erdem Turker Senalp, Richard Lee Bovey
  • Publication number: 20160085608
    Abstract: A system/method of diagnosing combinations of failures in a system includes receiving symptom data (116) including information relating to observed or detected symptoms in a system. The system/method generates (D4a, D4b, D5) failure data (118) including information relating to at least one most probable failures in the system based on the symptom data, and processes (D9) the failure data and the symptom data using an L-best inference (e.g. a Ranked Algorithm (RA)) technique in order to generate failure set data (120), the failure set data including information relating to at least one most probable combination of the failures that explain the symptoms.
    Type: Application
    Filed: April 22, 2014
    Publication date: March 24, 2016
    Applicant: BAE SYSTEMS plc
    Inventors: RICHARD LEE BOVEY, ERDEM TURKER SENALP
  • Publication number: 20150186335
    Abstract: A method of generating probability data for use in assessing performance of a system and a mission involving the system, the method including receiving (1002) model data representing a combined model of a system and a mission involving the system. The method further includes producing (1004) a Conjunctive Normal Form (CNF) encoding of the combined model data and producing (1006) a smooth deterministic Decomposable Negation Normal Form (sd-DNNF) representation of the CNF encoding. The method further includes producing (1008) an Arithmetic Circuit based on the sd-DNNF representation; receiving (306) observation data, and performing (308) inference on the observation data using the Arithmetic Circuit in order to produce probability values relating to performance of the system and the mission.
    Type: Application
    Filed: July 10, 2013
    Publication date: July 2, 2015
    Applicant: BAE SYSTEMS plc
    Inventors: Erdem Turker Senalp, Richard Lee Bovey
  • Publication number: 20150170442
    Abstract: A method of generating probability data for use in assessing performance of a system and a mission involving the system. The method includes receiving (302) a combined model describing a system diagnosis model describing symptoms, failures and link strengths (conditionals) of components/subsystems of the system, and a mission impact model, the mission impact model describing effects of the system on an ability to perform the mission. Observation data regarding a state of the system is also received (306) The observation data is used (308) in combination with the combined model to generate probability data for use in assessing performance of the system and the mission.
    Type: Application
    Filed: July 10, 2013
    Publication date: June 18, 2015
    Applicant: BAE SYSTEMS plc
    Inventors: Erdem Turker Senalp, Richard Lee Bovey
  • Patent number: 8595156
    Abstract: The method includes obtaining system model data representing a set of failures in a system including a plurality of components, a set of symptoms and relationships between at least some of the failures and symptoms. The system model data is used to create a Bayesian Network. Failure cases data is also obtained, where each failure case describes the presence/absence of at least one of the symptoms and the presence/absence of at least one of the failures. A learning operation on the Bayesian Network using the failure cases data is then performed and the contribution made by at least some of the failure cases to updating the parameters of the Bayesian Network during the learning operation is assessed. Information representing the assessed contribution of the at least some failure cases is displayed.
    Type: Grant
    Filed: September 30, 2009
    Date of Patent: November 26, 2013
    Assignee: BAE Systems PLC
    Inventors: Richard Lee Bovey, Erdem Turker Senalp
  • Patent number: 8347146
    Abstract: A method of assisting failure mode and effects analysis of a system having a plurality of components includes obtaining data associated with a component, or a group of components, of the system. The component or the group is associated with component type data or group type data, respectively, that includes data relating to at least one failure feature common to all components or groups, respectively, of that type. The component/group data and the component/group type data can then be stored and/or transferred for use in a failure mode and effects analysis of the system.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: January 1, 2013
    Assignee: BAE Systems PLC
    Inventors: John Brian Bell, Richard Lee Bovey
  • Publication number: 20110208680
    Abstract: The method includes obtaining system model data representing a set of failures in a system including a plurality of components, a set of symptoms and relationships between at least some of the failures and symptoms. The system model data is used to create a Bayesian Network. Failure cases data is also obtained, where each failure case describes the presence/absence of at least one of the symptoms and the presence/absence of at least one of the failures. A learning operation on the Bayesian Network using the failure cases data is then performed and the contribution made by at least some of the failure cases to updating the parameters of the Bayesian Network during the learning operation is assessed. Information representing the assessed contribution of the at least some failure cases is displayed.
    Type: Application
    Filed: September 30, 2009
    Publication date: August 25, 2011
    Applicant: BAE SYSTEMS plc
    Inventors: Richard Lee Bovey, Erdem Turker Senalp
  • Publication number: 20110099039
    Abstract: A method of assisting failure diagnosis in a system includes obtaining data including a probabilistic Bayesian Network describing a set of failures, a set of symptoms and probabilities of at least some of the symptoms being associated with at least some of the failures in a system. A cost value representing a cost associated with learning of a presence or absence of the symptom is obtained for at least some of the symptoms, as well as a plurality of information values, e.g. values representing measures of information gained by learning of the presence or absence of the symptom in relation to a respective plurality of the failures, associated with the symptom. The method then computes an information-for-cost value for the symptom based on the cost value and the plurality of information values.
    Type: Application
    Filed: April 17, 2009
    Publication date: April 28, 2011
    Inventor: Richard Lee Bovey
  • Publication number: 20100262867
    Abstract: A method of assisting failure mode and effects analysis of a system having a plurality of components includes obtaining data associated with a component, or a group of components, of the system. The component or the group is associated with component type data or group type data, respectively, that includes data relating to at least one failure feature common to all components or groups, respectively, of that type. The component/group data and the component/group type data can then be stored and/or transferred for use in a failure mode and effects analysis of the system.
    Type: Application
    Filed: November 26, 2008
    Publication date: October 14, 2010
    Applicant: BAE SYSTEMS PLC
    Inventors: John Brian Bell, Richard Lee Bovey