Patents by Inventor Richard Lee Kendrick

Richard Lee Kendrick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220187055
    Abstract: A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a laser source configured to provide light, a first ring resonator configured to produce a first frequency comb of light from the laser source, wherein at least a portion of the first frequency comb of light is directed at a moving object, a local oscillator configured to provide a reference beam, at least one waveguide structure configured to combine the reference beam with light reflected from the moving object to produce a measurement beam, a first multiplexer configured to split the measurement beam into a plurality of channels spaced in frequency, and a plurality of detectors configured to detect an intensity value of each channel of the plurality of channels to measure a distance between the digital measuring device and the moving object.
    Type: Application
    Filed: December 21, 2021
    Publication date: June 16, 2022
    Inventors: Richard Lee Kendrick, Joseph Marron
  • Patent number: 11320255
    Abstract: A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a tunable laser source implemented on the photonic integrated circuit configured to sweep over a frequency range to provide multi-wavelength light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, and a first detector implemented on the photonic integrated circuit configured to detect intensity values of the measurement beam to measure a distance between the digital measuring device and the moving object.
    Type: Grant
    Filed: August 11, 2020
    Date of Patent: May 3, 2022
    Assignee: RAYTHEON COMPANY
    Inventors: Richard Lee Kendrick, Joseph Marron
  • Publication number: 20220049945
    Abstract: A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a tunable laser source implemented on the photonic integrated circuit configured to sweep over a frequency range to provide multi-wavelength light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, and a first detector implemented on the photonic integrated circuit configured to detect intensity values of the measurement beam to measure a distance between the digital measuring device and the moving object.
    Type: Application
    Filed: August 11, 2020
    Publication date: February 17, 2022
    Inventors: Richard Lee Kendrick, Joseph Marron
  • Publication number: 20220019019
    Abstract: A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a laser source implemented on the photonic integrated circuit configured to provide light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, a first multiplexer implemented on the photonic integrated circuit configured to split the measurement beam into a plurality of channels, and a plurality of detectors implemented on the photonic integrated circuit configured to detect an intensity value of each channel to measure a distance between the digital measuring device and the moving object.
    Type: Application
    Filed: July 15, 2020
    Publication date: January 20, 2022
    Applicant: RAYTHEON COMPANY
    Inventors: Richard Lee Kendrick, Joseph Marron
  • Patent number: 11221204
    Abstract: A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a laser source configured to provide light, a first ring resonator configured to produce a first frequency comb of light from the laser source, wherein at least a portion of the first frequency comb of light is directed at a moving object, a local oscillator configured to provide a reference beam, at least one waveguide structure configured to combine the reference beam with light reflected from the moving object to produce a measurement beam, a first multiplexer configured to split the measurement beam into a plurality of channels spaced in frequency, and a plurality of detectors configured to detect an intensity value of each channel of the plurality of channels to measure a distance between the digital measuring device and the moving object.
    Type: Grant
    Filed: August 11, 2020
    Date of Patent: January 11, 2022
    Assignee: RAYTHEON COMPANY
    Inventors: Richard Lee Kendrick, Joseph Marron
  • Patent number: 11102426
    Abstract: An apparatus includes a first light source to produce a first reference light, a first pair of arrayed waveguide gratings (AWGs) to demultiplex a first optical signal and the first reference light, respectively, into multiple first signal beams and multiple first reference beams. A first heterodyne optical detector can mix the multiple first signal beams and the multiple first reference beams to generate first quadrature optical signals. A first pair of photo-detectors can convert the first quadrature optical signals to first in-phase (I) and quadrature (Q) electrical signals. The apparatus is implemented as a photonic integrated circuit (PIC) incorporating the first pair of AWGs, the first heterodyne optical detector and the first pair of photo-detectors.
    Type: Grant
    Filed: May 18, 2018
    Date of Patent: August 24, 2021
    Assignee: Lockheed Martin Corporation
    Inventors: Richard Lee Kendrick, Alan Lee Duncan
  • Patent number: 10753796
    Abstract: An apparatus includes multiple photonic integrated circuit (PIC) optical spectrometers, and an imaging plane coupled to the PIC optical spectrometers. Each PIC optical spectrometer includes multiple semiconductor chip layers. Each semiconductor chip layer includes multiple arrayed waveguide gratings (AWGs) and a number of on-chip optical detectors.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: August 25, 2020
    Assignee: LOCKHEED MARTIN CORPORATION
    Inventors: Alan Lee Duncan, Richard Lee Kendrick
  • Patent number: 10302409
    Abstract: An apparatus includes a number of photonic integrated circuit (PIC) imaging detector arrays, and multiple electronic integrated circuits (ICs) coupled to the PIC imaging detector arrays. Each PIC imaging detector array of includes a number of lenslets and a number of waveguides. At least some of the lenslets are coupled to multiple waveguides, and sets of two lenslets are configured to form interferometer channels.
    Type: Grant
    Filed: October 20, 2017
    Date of Patent: May 28, 2019
    Assignee: Lockheed Martin Corporation
    Inventors: Alan Lee Duncan, Richard Lee Kendrick
  • Patent number: 10012827
    Abstract: A device for combined-zoom interferometric imaging includes a number of first blades and second blades. Each of the first blades includes multiple first optical elements arranged in a first linear configuration for high-resolution interferometric imaging. Each of the second blades includes multiple second optical elements arranged in a second linear configuration for low-resolution interferometric imaging. Pairs of the first optical elements with different baseline lengths are coupled through a first array of optical waveguides to an optical processor. Pairs of the second optical elements with different baseline lengths are coupled through a second array of optical waveguides to the optical processor.
    Type: Grant
    Filed: May 12, 2016
    Date of Patent: July 3, 2018
    Assignee: LOCKHEED MARTIN CORPORATION
    Inventors: Alan L. Duncan, Richard Lee Kendrick
  • Patent number: 8913859
    Abstract: A device for interferometric imaging may comprise multiple optical elements arranged in a linear configuration. The device may also comprise multiple waveguide arrays (WGAs) each WGA of the multiple WGAs may include one or more WGs. Some of the WGs of each WGA of the multiple WGAs may be optically coupled to an optical element of the multiple optical elements. Each WG of a first WGA of the multiple WGAs is coupled to a first optical element of the multiple optical elements and is paired with a WG of a second WGA of the multiple WGAs that is coupled to second optical element of the multiple optical elements. The lengths of the paired WGs of the first and second WGAs of the multiple WGAs are not equal.
    Type: Grant
    Filed: April 10, 2012
    Date of Patent: December 16, 2014
    Assignee: Lockheed Martin Corporation
    Inventors: Alan L. Duncan, Richard Lee Kendrick
  • Patent number: 7352470
    Abstract: A spectrometer that implements the functionality of a Fizeau interferometer, the spectrometer including a collection device that is configured to collect a wavefront, a deformable mirror disposed at an image plane of the collection device, the deformable mirror having a plurality of sections, at least one of which is deformed to form interference patterns on the wavefront at the image plane, and a Fourier transformation module configured to derive spectral information from the interference patterns.
    Type: Grant
    Filed: February 28, 2005
    Date of Patent: April 1, 2008
    Assignee: Lockheed Martin Corporation
    Inventors: Richard Lee Kendrick, Eric H. Smith
  • Patent number: 7092103
    Abstract: A method for reducing a piston between a plurality of optical-collection devices configured to operate as a single optical device, such that the optical-collection devices are configured to capture select portions of a wavefront. The method includes pistoning an adjustable-optical path of at least one of the optical-collection devices through a plurality of steps; collecting a set of focused images and a set of defocused images for each step; Fourier transforming the first and second sets of images to generate respective first and second sets of spectral information for the wavefronts; deriving a set of wavefront errors based on the first and second sets of spectral information using a phase diversity algorithm; and deriving a piston value for the piston from the wavefront errors using a multi-color interferometry algorithm.
    Type: Grant
    Filed: April 9, 2004
    Date of Patent: August 15, 2006
    Assignee: Lockheed Martin Corporation
    Inventors: Richard Lee Kendrick, Eric H. Smith
  • Patent number: 7034945
    Abstract: A spectrometer configured to extract spectral information from a wavefront. The spectrometer includes a first collection device that includes an adjustable-optical path and configured to collect a first portion of a wavefront; a second collection device configured to collect a second portion of the wavefront; combiner optics configured to interfere the first and second portions of the wavefront at an image plane of the first and second collector devices to form interference patterns at the image plane; and a Fourier transformation module configured to derive spectral information from the interference patterns.
    Type: Grant
    Filed: July 25, 2003
    Date of Patent: April 25, 2006
    Assignee: Lockheed Martin Corporation
    Inventors: Richard Lee Kendrick, Eric H. Smith
  • Patent number: 6787747
    Abstract: A phase diversity wavefront correction system for use in a multiple aperture optical imaging system forms an in-focus image as a composite, focused image from the multiple apertures of the system and also forms an additional image which is deliberately made out of focus to a known extent. Taken together, the two images are processed to create one or more metrics, such as the power metric and sharpness metric. Neural networks are provided, each having an output corresponding to a parameter of an aperture of the imaging system, such as a piston position (axial displacement) or tip/tilt (angular displacement) of one telescope with respect to the others in the system.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: September 7, 2004
    Assignee: Lockheed Martin Corporation
    Inventors: Donald Francis Specht, Richard Lee Kendrick, Vassilis George Zarifis
  • Publication number: 20040095580
    Abstract: A spectrometer configured to extract spectral information from a wavefront. The spectrometer includes a first collection device that includes an adjustable-optical path and configured to collect a first portion of a wavefront; a second collection device configured to collect a second portion of the wavefront; combiner optics configured to interfere the first and second portions of the wavefront at an image plane of the first and second collector devices to form interference patterns at the image plane; and a Fourier transformation module configured to derive spectral information from the interference patterns.
    Type: Application
    Filed: July 25, 2003
    Publication date: May 20, 2004
    Applicant: Lockheed Martin Corporation
    Inventors: Richard Lee Kendrick, Eric H. Smith
  • Publication number: 20040056174
    Abstract: A phase diversity wavefront correction system for use in a multiple aperture optical imaging system forms an in-focus image as a composite, focused image from the multiple apertures of the system and also forms an additional image which is deliberately made out of focus to a known extent. Taken together, the two images are processed to create one or more metrics, such as the power metric and sharpness metric. Neural networks are provided, each having an output corresponding to a parameter of an aperture of the imaging system, such as a piston position (axial displacement) or tip/tilt (angular displacement) of one telescope with respect to the others in the system.
    Type: Application
    Filed: September 24, 2002
    Publication date: March 25, 2004
    Inventors: Donald Francis Specht, Richard Lee Kendrick, Vassilis George Zarifis
  • Patent number: 5905591
    Abstract: A multi-aperture imaging system for continuous dwell imaging of complex extended scenes which are not required to contain localized point sources. The multi-aperture imaging system includes a plurality of subaperture telescopes, each of which collect image data of an instantaneous field of view of an extended object scene within a field of regard of the imaging system. The image data collected by each subaperture telescope is transferred by respective optical delay paths to a beam combiner which combines all the image data in coherent fashion to form a single high resolution image of said object scene at a focal plane of the beam combiner. The subaperture telescopes are optically phased using phase diversity techniques which include using a phase diversity sensor located at the focal plane of the beam combiner to detect wavefront errors in the collected images.
    Type: Grant
    Filed: February 18, 1997
    Date of Patent: May 18, 1999
    Assignee: Lockheed Martin Corporation
    Inventors: Alan L. Duncan, Richard Lee Kendrick, Robert D. Sigler