Patents by Inventor Richard Michel VAN LEEUWEN

Richard Michel VAN LEEUWEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250029811
    Abstract: The embodiments of the present disclosure provide a sensor substrate for a charged particle optical device and/or a charged particle assessment apparatus, the sensor substrate comprising: at least one distance sensor configured to generate a measurement signal representative of a distance between the distance sensor and a facing surface of a target; and at least one charged particle optical component.
    Type: Application
    Filed: October 4, 2024
    Publication date: January 23, 2025
    Applicant: ASML Netherlands B.V.
    Inventors: Arthur Eduard OVERLACK, Ronald KROON, Richard Michel VAN LEEUWEN, Andre Luis RODRIGUES MANSANO, Herre Tjerk STEENSTRA, Erwin Robert Alexander VISSER
  • Publication number: 20240339291
    Abstract: The embodiments of the present disclosure provides a detector inspection device for interrogating at least part of a detector comprised in a charged particle-optical assessment apparatus, the detector inspection device comprising: a coupler configured to be positioned proximate to a detector element of a detector; and a device controller configured to apply a stimulating signal to the coupler to stimulate a response signal in the detector for interrogating at least part of the detector.
    Type: Application
    Filed: June 13, 2024
    Publication date: October 10, 2024
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Herre Tjerk STEENSTRA, Marco Jan-Jaco WIELAND, Alexius Otto LOOIJE, Richard Michel VAN LEEUWEN, Erwin Robert Alexander VISSER, Andre Luis RODRIGUES MANSANO, Gretchen Renée VAN T VEEN, Duije SEEKLES, Roelof Albert MARISSEN