Patents by Inventor Richard Moralee

Richard Moralee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • GRAIN-BASED MINEROLOGY SEGMENTATION SYSTEM AND METHOD
    Publication number: 20220397697
    Abstract: A method of enhancing a resolution of an EDS image of a sample includes generating an EDS image of the sample, generating a non-EDS image of the sample generating, using a machine learning algorithm, an enhanced resolution EDS image of the sample based on the generated feature map and based on the first EDS image, where a resolution of the enhanced resolution EDS image is higher than a resolution of the first EDS image.
    Type: Application
    Filed: October 23, 2020
    Publication date: December 15, 2022
    Applicant: CARL ZEISS MICROSCOPY GMBH
    Inventors: Matthew Andrew, William Thompson, Joaquin Correa, Edward Hill, Benjamin Tordoff, Richard Moralee
  • Method and data analysis system for semi-automated particle analysis using a charged particle beam
    Patent number: 10955368
    Abstract: A data analysis system is disclosed for generating analysis data depending on microscopic data of an object generated by a charged particle microscope. The microscopic data includes an image showing a structure. A graphical representation of the structure is displayed on the display by the graphical user interface. Separation data is generated representing at least one path of a separation cut, which separates pixels of the structure from each other. The separation cut is visually marked by the graphical user interface, depending on the separation data, by differently marking different area portions of the representation, which represent different pixels of the structure which are separated from each other by the separation cut. Separate analysis data are generated for each of at least two portions of the object, depending on the microscopic data and depending on the separation data.
    Type: Grant
    Filed: August 8, 2014
    Date of Patent: March 23, 2021
    Assignee: Carl Zeiss Microscopy Ltd.
    Inventors: Champ Gohil, Richard Moralee
  • METHOD AND DATA ANALYSIS SYSTEM FOR SEMI-AUTOMATED PARTICLE ANALYSIS USING A CHARGED PARTICLE BEAM
    Publication number: 20150046097
    Abstract: A data analysis system is disclosed for generating analysis data depending on microscopic data of an object generated by a charged particle microscope. The microscopic data includes an image showing a structure. A graphical representation of the structure is displayed on the display by the graphical user interface. Separation data is generated representing at least one path of a separation cut, which separates pixels of the structure from each other. The separation cut is visually marked by the graphical user interface, depending on the separation data, by differently marking different area portions of the representation, which represent different pixels of the structure which are separated from each other by the separation cut. Separate analysis data are generated for each of at least two portions of the object, depending on the microscopic data and depending on the separation data.
    Type: Application
    Filed: August 8, 2014
    Publication date: February 12, 2015
    Inventors: Champ Gohil, Richard Moralee