Patents by Inventor Richard Ortega

Richard Ortega has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6064717
    Abstract: An unrestricted motion device (10) has a sample holder (12), a detector holder (14) capable of independent multi-dimensional movement, a radiation source (16) and a radiation source holder (42) also capable of independent, multi-dimensional movement. In a preferred embodiment, the radiation source (16) is an x-ray tube. A controller (18) is connected to the sample holder (12) and detector holder (14) as well as to radiation source (16) so as to enable control of the independent movement of the sample holder (12) and detector holder (14), as well as operation of radiation source (16) and independent movement of radiation source (16). So long as any two of the sample holder (12), detector holder (14) or radiation source holder (42) are capable of multi-dimensional, independent movement, the entire diffraction cone (40) can be observed and analyzed. In a preferred embodiment, the holders are robots.
    Type: Grant
    Filed: November 21, 1997
    Date of Patent: May 16, 2000
    Assignee: Rigaku/USA, Inc.
    Inventors: Richard Ortega, Delrose Winter
  • Patent number: 5359640
    Abstract: An X-ray diffractometer having a simple yet accurate means for locating the surface of the sample to be examined with respect to the zero point of the X-ray (RS) is disclosed. Briefly stated, a laser (LA) and camera (KA) are positioned at preferably 90.degree. with respect to each other such that the intersection of the optical axis of the camera and the laser passes through the zero point of the diffractometer. In this fashion, the camera will see at its center, the zero point of the X-ray despite the fact that the X-ray is of course invisible to the naked eye. Accordingly, by movement of the sample (P) with respect to this camera image, the true and correct zero point of the X-ray with respect to the surface of the sample to be examined may be determined without the need for experimental and unnecessary X-ray or examination runs being taken.
    Type: Grant
    Filed: August 10, 1993
    Date of Patent: October 25, 1994
    Assignee: Siemens Industrial Automation, Inc.
    Inventors: Juergen Fink, Rolf Schipper, Kingsley Smith, Richard Ortega