Patents by Inventor Richard P. Janek

Richard P. Janek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9391267
    Abstract: A method for etching a stack with at least one metal layer in one or more cycles is provided. An initiation step is preformed, transforming part of the at least one metal layer into metal oxide, metal halide, or lattice damaged metallic sites. A reactive step is performed providing one or more cycles, where each cycle comprises providing an organic solvent vapor to form a solvated metal, metal halide, or metal oxide state and providing an organic ligand solvent to form volatile organometallic compounds.
    Type: Grant
    Filed: August 4, 2015
    Date of Patent: July 12, 2016
    Assignee: Lam Research Corporation
    Inventors: Meihua Shen, Harmeet Singh, Samantha S. H. Tan, Jeffrey Marks, Thorsten Lill, Richard P. Janek, Wenbing Yang, Prithu Sharma
  • Patent number: 9257638
    Abstract: A method for etching a stack with an Ru containing layer disposed below a hardmask and above a magnetic tunnel junction (MTJ) stack with pinned layer is provided. The hardmask is etched with a dry etch. The Ru containing layer is etched, where the etching uses hypochlorite and/or O3 based chemistries. The MTJ stack is etched. The MTJ stack is capped with dielectric materials. The pinned layer is etched following the MTJ capping.
    Type: Grant
    Filed: July 7, 2014
    Date of Patent: February 9, 2016
    Assignee: Lam Research Corporation
    Inventors: Samantha S.H. Tan, Wenbing Yang, Meihua Shen, Richard P. Janek, Jeffrey Marks, Harmeet Singh, Thorsten Lill
  • Publication number: 20150340603
    Abstract: A method for etching a stack with at least one metal layer in one or more cycles is provided. An initiation step is preformed, transforming part of the at least one metal layer into metal oxide, metal halide, or lattice damaged metallic sites. A reactive step is performed providing one or more cycles, where each cycle comprises providing an organic solvent vapor to form a solvated metal, metal halide, or metal oxide state and providing an organic ligand solvent to form volatile organometallic compounds.
    Type: Application
    Filed: August 4, 2015
    Publication date: November 26, 2015
    Inventors: Meihua SHEN, Harmeet SINGH, Samantha S.H. TAN, Jeffrey MARKS, Thorsten LILL, Richard P. JANEK, Wenbing YANG, Prithu SHARMA
  • Publication number: 20150280114
    Abstract: A method for etching a stack with at least one metal layer in one or more cycles is provided. An initiation step is preformed, transforming part of the at least one metal layer into metal oxide, metal halide, or lattice damaged metallic sites. A reactive step is performed providing one or more cycles, where each cycle comprises providing an organic solvent vapor to form a solvated metal, metal halide, or metal oxide state and providing an organic ligand solvent to form volatile organometallic compounds. A desorption of the volatile organometallic compounds is performed.
    Type: Application
    Filed: July 8, 2014
    Publication date: October 1, 2015
    Inventors: Meihua SHEN, Harmeet SINGH, Samantha S.H. TAN, Jeffrey MARKS, Thorsten LILL, Richard P. JANEK, Wenbing YANG, Prithu SHARMA
  • Publication number: 20150280113
    Abstract: A method for etching a stack with an Ru containing layer disposed below a hardmask and above a magnetic tunnel junction (MTJ) stack with pinned layer is provided. The hardmask is etched with a dry etch. The Ru containing layer is etched, where the etching uses hypochlorite and/or O3 based chemistries. The MTJ stack is etched. The MTJ stack is capped with dielectric materials. The pinned layer is etched following the MTJ capping.
    Type: Application
    Filed: July 7, 2014
    Publication date: October 1, 2015
    Inventors: Samantha S.H. TAN, Wenbing YANG, Meihua SHEN, Richard P. JANEK, Jeffrey MARKS, Harmeet SINGH, Thorsten LILL
  • Patent number: 9130158
    Abstract: A method for etching a stack with at least one metal layer in one or more cycles is provided. An initiation step is preformed, transforming part of the at least one metal layer into metal oxide, metal halide, or lattice damaged metallic sites. A reactive step is performed providing one or more cycles, where each cycle comprises providing an organic solvent vapor to form a solvated metal, metal halide, or metal oxide state and providing an organic ligand solvent to form volatile organometallic compounds. A desorption of the volatile organometallic compounds is performed.
    Type: Grant
    Filed: July 8, 2014
    Date of Patent: September 8, 2015
    Assignee: Lam Research Corporation
    Inventors: Meihua Shen, Harmeet Singh, Samantha S. H. Tan, Jeffrey Marks, Thorsten Lill, Richard P. Janek, Wenbing Yang, Prithu Sharma
  • Patent number: 8524329
    Abstract: A method for providing electroless plating is provided. An amorphous carbon barrier layer is formed over the low-k dielectric layer by providing a flow a deposition gas, comprising a hydrocarbon, H2, and an oxygen free diluent, forming a plasma from the deposition gas, and stopping the flow of the deposition gas. The amorphous carbon barrier layer is conditioned by providing a flow of a conditioning gas comprising H2 and a diluent, forming a plasma from the conditioning gas, which conditions a top surface of the amorphous carbon barrier layer, and stopping the flow of the conditioning gas. The amorphous carbon barrier layer is functionalized by providing a flow of a functionalizing gas comprising NH3 or H2 and N2, forming a plasma from the functionalizing gas, and stopping the flow of the functionalizing gas. An electroless process is provided to form an electrode over the barrier layer.
    Type: Grant
    Filed: December 13, 2011
    Date of Patent: September 3, 2013
    Assignee: Lam Research Corporation
    Inventors: Yezdi N. Dordi, Richard P. Janek, Dries Dictus
  • Publication number: 20130149461
    Abstract: A method for providing electroless plating is provided. An amorphous carbon barrier layer is formed over the low-k dielectric layer by providing a flow a deposition gas, comprising a hydrocarbon, H2, and an oxygen free diluent, forming a plasma from the deposition gas, and stopping the flow of the deposition gas. The amorphous carbon barrier layer is conditioned by providing a flow of a conditioning gas comprising H2 and a diluent, forming a plasma from the conditioning gas, which conditions a top surface of the amorphous carbon barrier layer, and stopping the flow of the conditioning gas. The amorphous carbon barrier layer is functionalized by providing a flow of a functionalizing gas comprising NH3 or H2 and N2, forming a plasma from the functionalizing gas, and stopping the flow of the functionalizing gas. An electroless process is provided to form an electrode over the barrier layer.
    Type: Application
    Filed: December 13, 2011
    Publication date: June 13, 2013
    Applicant: Lam Research Corporation
    Inventors: Yezdi N. DORDI, Richard P. JANEK, Dries DICTUS
  • Patent number: 7022287
    Abstract: The present invention discloses an electrochemical device for detecting single particles, and methods for using such a device to achieve high sensitivity for detecting particles such as bacteria, viruses, aggregates, immuno-complexes, molecules, or ionic species. The device provides for affinity-based electrochemical detection of particles with single-particle sensitivity. The disclosed device and methods are based on microelectrodes with surface-attached, affinity ligands (e.g., antibodies, combinatorial peptides, glycolipids) that bind selectively to some target particle species. The electrodes electrolyze chemical species present in the particle-containing solution, and particle interaction with a sensor element modulates its electrolytic activity. The devices may be used individually, employed as sensors, used in arrays for a single specific type of particle or for a range of particle types, or configured into arrays of sensors having both these attributes.
    Type: Grant
    Filed: May 8, 2002
    Date of Patent: April 4, 2006
    Assignee: Sandia National Laboratories
    Inventors: Joseph Schoeniger, Albert W. Flounders, Robert C. Hughes, Antonio J. Ricco, Karl Wally, Stanley H. Kravitz, Richard P. Janek
  • Publication number: 20030211637
    Abstract: The present invention discloses an electrochemical device for detecting single particles, and methods for using such a device to achieve high sensitivity for detecting particles such as bacteria, viruses, aggregates, immuno-complexes, molecules, or ionic species. The device provides for affinity-based electrochemical detection of particles with single-particle sensitivity. The disclosed device and methods are based on microelectrodes with surface-attached, affinity ligands (e.g., antibodies, combinatorial peptides, glycolipids) that bind selectively to some target particle species. The electrodes electrolyze chemical species present in the particle-containing solution, and particle interaction with a sensor element modulates its electrolytic activity. The devices may be used individually, employed as sensors, used in arrays for a single specific type of particle or for a range of particle types, or configured into arrays of sensors having both these attributes.
    Type: Application
    Filed: May 8, 2002
    Publication date: November 13, 2003
    Inventors: Joseph Schoeniger, Albert W. Flounders, Robert C. Hughes, Antonio J. Ricco, Karl Wally, Stanley H. Kravitz, Richard P. Janek