Abstract: An interactive computer controlled management system for real-time data gathering and analysis of process information relating to a plurality of data sources in a facility and for controlling process functions of the data sources. In a preferred embodiment, the data sources include gas cabinet panels and related process equipment typically found in a wafer fab facility. The system operates in a distributed processor environment and includes a host processor having graphic, control and user interfaces and a multi-ported processor networked to the host processor. The multi-ported process includes protocol sensitive hardware interfaces for communication with the programmable logic controllers of each particular data source. The multi-ported processor also includes software means for emulating a common protocol such that each gas cabinet or other connected device appears to the host processor as an address location in a memory of the multi-ported processor.