Patents by Inventor Richard Q. Lee

Richard Q. Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110032253
    Abstract: A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.
    Type: Application
    Filed: August 16, 2010
    Publication date: February 10, 2011
    Inventors: Afroz J. Zaman, Richard Q. Lee, William G. Darby, Philip J. Barr, Kevin M. Lambert, Felix A. Miranda
  • Patent number: 7876276
    Abstract: A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.
    Type: Grant
    Filed: August 2, 2006
    Date of Patent: January 25, 2011
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Afroz J. Zaman, Richard Q. Lee, William G. Darby, Philip J. Barr, Kevin M Lambert, Felix A. Miranda
  • Patent number: 5872542
    Abstract: An antenna (10, 110, 210) comprising a ground layer (30, 130, 230), a feed layer (50, 150, 250), an antenna layer (40, 140, 240) and a transparent dielectric substrate (20, 120, 220) interposed between two of the layers (30 and 40, 140 and 150, 230 and 250). An electromagnetic field is produced between the ground layer (30, 130, 230) and the antenna layer (40, 140, 240) when the feed and ground layers (50 and 30, 150 and 130, 250 and 230) are exposed to a microwave frequency above 3,000 megahertz for transmission and when the antenna and ground layers (40 and 30, 140 and 130, 240 and 230) are exposed to a microwave frequency above 3,000 megahertz, for reception. The ground layer (30, 130, 230), feed layer (50, 150, 250) and antenna layer (40, 140, 240) are made of an optically transparent and electrically conductive material. About 30% of the visible light impinging on the antenna (10, 110, 210) passes through the antenna.
    Type: Grant
    Filed: February 13, 1998
    Date of Patent: February 16, 1999
    Assignee: Federal Data Corporation
    Inventors: Rainee Simons, Richard Q. Lee