Abstract: A floor planning tool is provided that performs the functions that are typically performed by floor planning tools, but in addition, determines the supply of routing resources and the demand on routing resources for all routing channels while applying variable routing rules and static timing estimations to arrive at a preliminary routed floor plan. This drastically reduces the number of iterations that subsequently will need to be performed by the floor planning tool and by routing and static timing analysis tools to arrive at a final routed floor plan.

Abstract: A floor planning tool is provided that performs the functions that are typically performed by floor planning tools, but in addition, determines the supply of routing resources and the demand on routing resources for all routing channels while applying variable routing rules and static timing estimations to arrive at a preliminary routed floor plan. This drastically reduces the number of iterations that subsequently will need to be performed by the floor planning tool and by routing and static timing analysis tools to arrive at a final routed floor plan.

Abstract: Differences between block interfaces of a partitioned logic block in two floorplans of an integrated circuit can be determined by comparing an image of pins of a partitioned logic block in a first floorplan of the integrated circuit with an image of pins of the partitioned logic block in a second floorplan of the integrated circuit. The second floorplan can represent a new floorplan design resulting from a change to an integrated circuit design represented by the first floorplan. If no differences exist between pins of the partitioned logic block in the first and second floorplans, information representing the partitioned logic block in the second floorplan can be substituted with information representing the partitioned logic block in the first floorplan.

Abstract: Systems and methods are disclosed herein for determining the placement of a standard cell, representing a semiconductor component in a design stage, on an integrated circuit die. One embodiment of a method, among others, comprises analyzing regions of a semiconductor die with respect to the susceptibility of the region to be exposed to radiation. This method further comprises placing the standard cell in one of the analyzed regions of the semiconductor die, the standard cell being placed based on the sensitivity of the standard cell to radiation. The method may also comprise running an algorithm, e.g. using a component placement engine, for determining the placement of semiconductor components on an integrated circuit die.

Abstract: An apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC) includes operating a clock associated with the IC at a frequency (fTARGET) at which IC operation is sought to be determined, measuring the actual clock period (TCLOCK—OUT) at a clock output, scan testing the IC, measuring the actual clock period (TSCAN—CLOCK—OUT) at the clock output, determining a delay by calculating the difference between TSCAN—CLOCK—OUT and TCLOCK—OUT, and compensating for the delay by increasing the clock frequency during scan test.

Abstract: Systems and methods are disclosed herein for determining the placement of storage and non-storage cells or components, representing a semiconductor component in a design stage, on an integrated circuit die. In one embodiment, regions of a semiconductor die are analyzed with respect to the susceptibility of a region to be exposed to radiation and the distance between a storage component and a local clock buffer. The radiation, for instance, may be alpha particle radiation emitted from lead (Pb) isotopes in solder bumps formed on the integrated circuit die. The distance, spatial positioning and/or physical proximity of a selected local clock buffer and a storage component are preferably selected so that the skew between the storage component and the local clock buffer is about 30 picoseconds or less.

Abstract: Systems and methods are disclosed herein for determining the placement of a standard cell, representing a semiconductor component in a design stage, on an integrated circuit die. One embodiment of a method, among others, comprises analyzing regions of a semiconductor die with respect to the susceptibility of the region to be exposed to radiation. This method further comprises placing the standard cell in one of the analyzed regions of the semiconductor die, the standard cell being placed based on the sensitivity of the standard cell to radiation. The method may also comprise running an algorithm, e.g. using a component placement engine, for determining the placement of semiconductor components on an integrated circuit die.

Abstract: Systems and methods are disclosed herein for determining the placement of a standard cell, representing a semiconductor component in a design stage, on an integrated circuit die. One embodiment of a method, among others, comprises analyzing regions of a semiconductor die with respect to the susceptibility of the region to be exposed to radiation. This method further comprises placing the standard cell in one of the analyzed regions of the semiconductor die, the standard cell being placed based on the sensitivity of the standard cell to radiation. The method may also comprise running an algorithm, e.g. using a component placement engine, for determining the placement of semiconductor components on an integrated circuit die.

Abstract: An apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC) includes operating a clock associated with the IC at a frequency (fTARGET) at which IC operation is sought to be determined, measuring the actual clock period (TCLOCK_OUT) at a clock output, scan testing the IC, measuring the actual clock period (TSCAN_CLOCK_OUT) at the clock output, determining a delay by calculating the difference between TSCAN_CLOCK_OUT and TOLOCK_OUT, and compensating for the delay by increasing the clock frequency during scan test.

Abstract: A method of routing an integrated circuit signal bus is provided. One of a set of blocks having ports that are to be connected to the signal bus is selected as a primary block, the ports of which are positioned so that no two ports of that block lie within the same routing track parallel to the closest portion of a primary bus route. All other blocks, termed secondary blocks, have ports that are positioned so that no two ports of any secondary block reside within the same routing track perpendicular to the closest portion of the primary bus route. A primary connection for each signal of the signal bus is then placed over each port of the primary block substantially along the length of the primary route. Each port of each secondary block then has a secondary track connecting it in a perpendicular fashion to the proper primary track.

Abstract: A method of routing an integrated circuit signal bus is provided. One of a set of blocks having ports that are to be connected to the signal bus is selected as a primary block, the ports of which are positioned so that no two ports of that block lie within the same routing track parallel to the closest portion of a primary bus route. All other blocks, termed secondary blocks, have ports that are positioned so that no two ports of any secondary block reside within the same routing track perpendicular to the closest portion of the primary bus route. A primary connection for each signal of the signal bus is then placed over each port of the primary block substantially along the length of the primary route. Each port of each secondary block then has a secondary track connecting it in a perpendicular fashion to the proper primary track.

Abstract: A method for minimizing clock skew in a balanced tree when interfacing to an unbalanced load is presented. Unused portions of the balanced tree are replaced by a loading equivalent circuit to create a physically balanced load. In the preferred embodiment, the loading equivalent circuit is implemented with a single-pole resistor-capacitor circuit that has been modeled to match the RC characteristics of the replaced branch of the tree.

Abstract: A method for minimizing clock skew in a balanced tree when interfacing to an unbalanced load is presented. Unused portions of the balanced tree are replaced by a loading equivalent circuit to create a physically balanced load. In the preferred embodiment, the loading equivalent circuit is implemented with a single-pole resistor-capacitor circuit that has been modeled to match the RC characteristics of the replaced branch of the tree.