Patents by Inventor Richard Studnicki

Richard Studnicki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for IDDQ tests
    Patent number: 9103877
    Abstract: A method for conducting IDDQ tests for a device having a plurality of test sites is disclosed. The method includes identifying voltage ranges for each of the plurality of test sites, closing a switch in each of a plurality of voltage drop setup circuits, and setting each of the plurality of test sites to one of a plurality of logic states. Each of the plurality of voltage drop setup circuits includes a resistor parallelly coupled to the switch. One terminal of each voltage drop setup circuit is coupled to a voltage source and the other terminal of each voltage drop setup circuit is coupled to respective tester channels of each of the plurality of test sites. After opening the switch in each of the plurality of voltage drop setup circuits, the voltage drop across the resistor in each voltage drop setup circuit is measured.
    Type: Grant
    Filed: April 3, 2012
    Date of Patent: August 11, 2015
    Assignee: SanDisk Technologies Inc.
    Inventor: Richard Studnicki
  • APPARATUS AND METHOD FOR IDDQ TESTS
    Publication number: 20130262018
    Abstract: A method for conducting IDDQ tests for a device having a plurality of test sites is disclosed. The method includes identifying voltage ranges for each of the plurality of test sites, closing a switch in each of a plurality of voltage drop setup circuits, and setting each of the plurality of test sites to one of a plurality of logic states. Each of the plurality of voltage drop setup circuits includes a resistor parallelly coupled to the switch. One terminal of each voltage drop setup circuit is coupled to a voltage source and the other terminal of each voltage drop setup circuit is coupled to respective tester channels of each of the plurality of test sites. After opening the switch in each of the plurality of voltage drop setup circuits, the voltage drop across the resistor in each voltage drop setup circuit is measured.
    Type: Application
    Filed: April 3, 2012
    Publication date: October 3, 2013
    Applicant: SANDISK TECHNOLOGIES INC.
    Inventor: Richard Studnicki