Abstract: There is disclosed herein systems and methods for non-destructive testing of test bodies. The method includes positioning the test body in a test position, transmitting ultrasonic waves, by a transmission device, into the test body at one or more locations on the surface of one end of the test body; receiving portions of the ultrasonic waves, by a receiving device, that are reflected from or through the test body at each of the locations on the surface of one end of the test body; generating, by a wave generating device, at least one test wave form based on the portions corresponding to each of the locations on the surface of one end of the test body; comparing, by a wave processing device, the test wave form for the body at each of the locations to a respective one of a set of calibration wave forms for a reference body.

Abstract: In a new method of manufacturing eddy-current probes, particularly such probes for the scanning of a test surface generated by a non-flat profile, a thin, flexible support layer is laid against the test surface so that it conforms exactly thereto. One or more tests coils have a sector thereof laid against the back face of the support layer so that the coil sector also conforms to the same profile in the plane of the coil and the profile. A plurality of separate ferrite core elememts are now laid inside the loop of the coil, or the loops of the coils, and pressed against the coil so as to form a core that also conforms to the profile to be scanned. The remainder of the coil (or coils) is pressed against the backs of the ferrite elements and the assembly is encapsulated to make it rigid enough for mounting in a test apparatus for scanning over the surface to be tested.

Abstract: In a new method of manufacturing eddy-current probes, particularly such probes for the scanning of a test surface generated by a non-flat profile, a thin, flexible support layer is laid against the test surface so that it conforms exactly thereto. One or more test coils have a sector thereof laid against the back face of the support layer so that the coil sector also conforms to the same profile in the plane of the coil and the profile. A plurality of separate ferrite core elements are now laid inside the loop of the coil, or the loops of the coils, and pressed against the coil so as to form a core that also conforms to the profile to be scanned. The remainder of the coil (or coils) is pressed against the backs of the ferrite elements and the assembly is encapsulated to make it rigid enough for mounting in a test apparatus for scanning over the surface to be tested. The front face of the support layer is the "active" surface of the probe and conforms precisely with the profile, since it was generated thereby.