Patents by Inventor Richard T. Meyer

Richard T. Meyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8467996
    Abstract: Collecting and analyzing spectral data can be challenging when multiple analysis instruments need to be integrated and monitored by a quality control agent within a laboratory, industrial plant, field operation, or even an aerospace environment. The spectral analysis system and method, as presented, provides improved quality control, process control, and data management through unique feedback mechanisms between all hardware and software components within an analytical environment. Through spectral analysis presented, meaningful information is extracted from a spectral signal and fed back into the spectral analysis system to enhance overall system performance. A centralized database is provided to allow multiple users the opportunity to query the database for historical spectral records that can lead to the generation of meaningful reports.
    Type: Grant
    Filed: February 9, 2011
    Date of Patent: June 18, 2013
    Inventors: Jorge E Perez, Richard T Meyer
  • Publication number: 20120203510
    Abstract: Collecting and analyzing spectral data can be challenging when multiple analysis instruments need to be integrated and monitored by a quality control agent within a laboratory, industrial plant, field operation, or even an aerospace environment. The spectral analysis system and method, as presented, provides improved quality control, process control, and data management through unique feedback mechanisms between all hardware and software components within an analytical environment. Through spectral analysis presented, meaningful information is extracted from a spectral signal and fed back into the spectral analysis system to enhance overall system performance. A centralized database is provided to allow multiple users the opportunity to query the database for historical spectral records that can lead to the generation of meaningful reports.
    Type: Application
    Filed: February 9, 2011
    Publication date: August 9, 2012
    Applicant: CIC Photonics, Inc.
    Inventors: Jorge E. Perez, Richard T. Meyer
  • Patent number: 7607404
    Abstract: An automatic milking system having a vacuum pump arrangement, the automatic milking system includes a milking system controller arranged to control milking system parameters and a vacuum pump arrangement having a vacuum system controller for controlling vacuum system parameters. Communication means is coupled to the vacuum system controller and to the milking system controller for establishing communication between the vacuum system controllers and the milking system controller. The milking system controller has signal transmitting means for transmitting a message to the vacuum system controller. The vacuum system controller has signal receiving means for receiving the message from the milking system controller, and the vacuum system controller is arranged to change a least one of the vacuum system parameters depending on the received message.
    Type: Grant
    Filed: April 24, 2002
    Date of Patent: October 27, 2009
    Assignee: Delaval Holding AB
    Inventors: Mats Stellnert, Richard T. Meyer
  • Patent number: 6748334
    Abstract: A system and method for detection of impurities in gases comprising a Fourier transform infrared spectrometer and computation devices for system control, spectral analysis, and chemometrics.
    Type: Grant
    Filed: December 6, 2000
    Date of Patent: June 8, 2004
    Inventors: Jorge E. Perez, Richard T. Meyer