Patents by Inventor Richard Tovey

Richard Tovey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9087673
    Abstract: A sample holder assembly includes a sample tray, a base plate, a stage mount, and a calibration standard mounted onto the stage mount. Three mating structures on the bottom of the base plate mate with corresponding structures on a stage mount that is attached to the sample stage of the SEM. An optional contacting conductor provides electrical contact between the stage mount and the base plate so that charge generated on the sample by the electron beam can leave the sample through the sample conductive layer to the sample tray, to the base plate, to the stage mount, and through the grounded stage.
    Type: Grant
    Filed: January 6, 2014
    Date of Patent: July 21, 2015
    Assignee: FEI COMPANY
    Inventors: Matthew Barrett, Michael D. Smith, Michal Geryk, Paul Scagnetti, Richard Tovey
  • Publication number: 20140191125
    Abstract: A sample holder assembly includes a sample tray, a base plate, a stage mount, and a calibration standard mounted onto the stage mount. Three mating structures on the bottom of the base plate mate with corresponding structures on a stage mount that is attached to the sample stage of the SEM. An optional contacting conductor provides electrical contact between the stage mount and the base plate so that charge generated on the sample by the electron beam can leave the sample through the sample conductive layer to the sample tray, to the base plate, to the stage mount, and through the grounded stage.
    Type: Application
    Filed: January 6, 2014
    Publication date: July 10, 2014
    Applicant: FEI Company
    Inventors: Matthew Barrett, Michael D. Smith, Michal Geryk, Paul Scagnetti, Richard Tovey
  • Patent number: 8624199
    Abstract: A sample holder assembly includes a sample tray, a base plate, a stage mount, and a calibration standard mounted onto the stage mount. Three mating structures on the bottom of the base plate mate with corresponding structures on a stage mount that is attached to the sample stage of the SEM. An optional contacting conductor provides electrical contact between the stage mount and the base plate so that charge generated on the sample by the electron beam can leave the sample through the sample conductive layer to the sample tray, to the base plate, to the stage mount, and through the grounded stage.
    Type: Grant
    Filed: October 28, 2011
    Date of Patent: January 7, 2014
    Assignee: FEI Company
    Inventors: Matthew Barrett, Michael D. Smith, Michal Geryk, Paul Scagnetti, Richard Tovey
  • Publication number: 20130105677
    Abstract: A sample holder assembly includes a sample tray, a base plate, a stage mount, and a calibration standard mounted onto the stage mount. Three mating structures on the bottom of the base plate mate with corresponding structures on a stage mount that is attached to the sample stage of the SEM. An optional contacting conductor provides electrical contact between the stage mount and the base plate so that charge generated on the sample by the electron beam can leave the sample through the sample conductive layer to the sample tray, to the base plate, to the stage mount, and through the grounded stage.
    Type: Application
    Filed: October 28, 2011
    Publication date: May 2, 2013
    Applicant: FEI Company
    Inventors: Matthew Barrett, Michael D. Smith, Michal Geryk, Paul Scagnetti, Richard Tovey