Abstract: An integrated circuit semiconductor chip or the like is packaged on a leadless chip carrier. The chip carrier comprises a substrate with an integral coplanar extension frangibly connected to one or more sides. Each such extension has a metallized conductive area forming a shorting bar, interconnecting at least some of the metallized conductive traces formed on the substrate. The extensions with the shorting bars remain attached to the substrate while the chip is being installed to prevent damage to the chip from electrostatic discharges. After chip installation is completed, the extensions are separated from the substrate, thereby removing the interconnections between the traces. In a preferred embodiment, a scoring line along the peripheral edge of the substrate provides the frangible connection to the extension, and the extension is provided with holes along the scoring line to allow side metallization of the substrate.