Abstract: An ion detection arrangement 140 for a time-of-flight (TOF) mass spectrometer 10 includes a beam splitter formed as a mesh 150 at the end of the TOF acceleration and detection chamber 110. Ions enter the detection arrangement through a common entrance window and are then divided by the beam splitter. Those ions striking the mesh 150 generate secondary electrons 160 which are detected by a microchannel plate forming a first detector 170. Those ions passing through the ion beam splitter are detected directly by a second detector 190 also formed from a microchannel plate. The two detectors are each connected to a corresponding data acquisition system 180, 200 and the data obtained by each are combined to generate a mass spectrum. The problems of detector saturation are thus avoided.