Patents by Inventor Rick Mayer

Rick Mayer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automatically selecting wafers for review
    Patent number: 7324863
    Abstract: In one embodiment, the present invention includes a method for receiving a set of inspection files each corresponding to an inspection performed on a wafer of a set of wafers, automatically analyzing the set of inspection files to select at least one inspection file corresponding to a predetermined rule set, and identifying the wafer(s) associated with the selected inspection file(s). Other embodiments are described and claimed.
    Type: Grant
    Filed: March 30, 2006
    Date of Patent: January 29, 2008
    Assignee: Intel Corporation
    Inventors: Paul P. Thirumalai, Rick Mayer, Mike J. Wodarczyk
  • Automatically selecting wafers for review
    Publication number: 20070239306
    Abstract: In one embodiment, the present invention includes a method for receiving a set of inspection files each corresponding to an inspection performed on a wafer of a set of wafers, automatically analyzing the set of inspection files to select at least one inspection file corresponding to a predetermined rule set, and identifying the wafer(s) associated with the selected inspection file(s). Other embodiments are described and claimed.
    Type: Application
    Filed: March 30, 2006
    Publication date: October 11, 2007
    Inventors: Paul Thirumalai, Rick Mayer, Mike Wodarczyk