Patents by Inventor Ricky A. Kuehn

Ricky A. Kuehn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement apparatus, system, and method for obtaining conductivity measurements of a surface of a structure
    Patent number: 10677746
    Abstract: There is provided a measurement apparatus for obtaining conductivity measurements of a surface of a structure. The apparatus has a housing, and a pair of support legs depending from the housing. Each support leg has a first end, wherein the first ends define a support leg plane. The apparatus has a pair of conductive measurement probes slidably disposed between the support legs, and at least one force applying member coupled to the housing. The at least one force applying member applies a biasing force to cause the pair of conductive measurement probes to extend a predetermined distance beyond the support leg plane. A downward applied force applied to the housing, when the conductive measurement probes are in contact with the surface, causes a displacement of the conductive measurement probes, until the first ends of the support legs contact the surface. Conductivity measurements between the conductive measurement probes are consistently obtained.
    Type: Grant
    Filed: November 18, 2017
    Date of Patent: June 9, 2020
    Assignee: The Boeing Company
    Inventors: Mark A. Schmier, II, Gary E. Jones, Ricky A. Kuehn, Heather Burns, Carlos Portugal
  • Measurement Apparatus, System, and Method for Obtaining Conductivity Measurements of a Surface of a Structure
    Publication number: 20190154614
    Abstract: There is provided a measurement apparatus for obtaining conductivity measurements of a surface of a structure. The apparatus has a housing, and a pair of support legs depending from the housing. Each support leg has a first end, wherein the first ends define a support leg plane. The apparatus has a pair of conductive measurement probes slidably disposed between the support legs, and at least one force applying member coupled to the housing. The at least one force applying member applies a biasing force to cause the pair of conductive measurement probes to extend a predetermined distance beyond the support leg plane. A downward applied force applied to the housing, when the conductive measurement probes are in contact with the surface, causes a displacement of the conductive measurement probes, until the first ends of the support legs contact the surface. Conductivity measurements between the conductive measurement probes are consistently obtained.
    Type: Application
    Filed: November 18, 2017
    Publication date: May 23, 2019
    Inventors: Mark A. Schmier II, Gary E. Jones, Ricky A. Kuehn, Heather Burns, Carlos Portugal