Patents by Inventor Ricky Yang

Ricky Yang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Alternative methodology for defect simulation and system
    Patent number: 7356787
    Abstract: A system for defect simulation is provided. A defect layout generator generates a defect layout comprising a given number of spot defects of a given size. A processor first compares the defect layout and a provided circuit layout comprising a plurality of conductive regions. The processor further determines whether the spot defects are located on the conductive regions, and determines whether short-circuits and/or open circuits are caused by the spot defects in the conductive regions.
    Type: Grant
    Filed: April 6, 2005
    Date of Patent: April 8, 2008
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Jui-Jung Yan, Chung-Min Fu, Ricky Yang
  • Alternative methodology for defect simulation and system
    Publication number: 20060230371
    Abstract: A system for defect simulation is provided. A defect layout generator generates a defect layout comprising a given number of spot defects of a given size. A processor first compares the defect layout and a provided circuit layout comprising a plurality of conductive regions. The processor further determines whether the spot defects are located on the conductive regions, and determines whether short-circuits and/or open circuits are caused by the spot defects in the conductive regions.
    Type: Application
    Filed: April 6, 2005
    Publication date: October 12, 2006
    Inventors: Jui-Jung Yan, Chung-Min Fu, Ricky Yang