Patents by Inventor RIGALANTU JI

RIGALANTU JI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12188793
    Abstract: A heterodyne two-dimensional grating measuring device and measuring method thereof includes a light source, a reading head, a photoelectric receiving module, and a processor. The light source is configured to generate two beams of linearly polarized light having characteristics of overlapping, polarization orthogonal, and fixed frequency difference. The reading head is configured to receive the two beams of the linearly polarized light, the two beams of the linearly polarized light are respectively incident on a surface of a moving two-dimensional measuring grating to generate ±1-order diffracted lights of two dimensions, and the ±1-order diffracted lights are respectively incident to the photoelectric receiving module through the reading head.
    Type: Grant
    Filed: March 31, 2022
    Date of Patent: January 7, 2025
    Assignee: CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, ACADEMY OF SCIENCES
    Inventors: Wenhao Li, Zhaowu Liu, Hongzhu Yu, Wei Wang, Rigalantu Ji, Xuefeng Yao
  • Patent number: 11860057
    Abstract: A heterodyne one-dimensional grating measuring device and measuring method thereof, including a light source, a reading head, a photoelectric receiving module, and a signal processing system. The light source is configured to generate two linearly polarized lights having characteristics of overlapping, polarization orthogonal, and fixed frequency difference. The reading head is configured to receive two beams of polarized lights and be respectively incident on a surface of a moving measuring grating to generate a +1-order diffracted light and a ?1-order diffracted light. The photoelectric receiving module is configured to receive the +1-order diffracted light and the ?1-order diffracted light to form two paths of beat frequency signals. The signal processing system is configured to perform differential calculation on the two paths of the beat frequency signals to realize a displacement measurement of single diffraction of the measuring grating for four-fold optical subdivision.
    Type: Grant
    Filed: March 31, 2022
    Date of Patent: January 2, 2024
    Assignee: CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES
    Inventors: Wenhao Li, Zhaowu Liu, Wei Wang, Hongzhu Yu, Rigalantu Ji, Xuefeng Yao
  • Publication number: 20220228890
    Abstract: A heterodyne two-dimensional grating measuring device and measuring method thereof includes a light source, a reading head, a photoelectric receiving module, and a signal processing system. The light source is configured to generate two beams of linearly polarized lights having characteristics of overlapping, polarization orthogonal, and fixed frequency difference. The reading head is configured to receive the two beams of the linearly polarized lights, the two beams of the linearly polarized lights are respectively incident on a surface of a moving two-dimensional measuring grating to generate ±1-order diffracted lights of two dimensions, and the ±1-order diffracted lights are respectively incident to the photoelectric receiving module through the reading head.
    Type: Application
    Filed: March 31, 2022
    Publication date: July 21, 2022
    Inventors: WENHAO LI, Zhaowu Liu, Hongzhu Yu, Wei Wang, Rigalantu Ji, Xuefeng Yao
  • Publication number: 20220221372
    Abstract: A heterodyne one-dimensional grating measuring device and measuring method thereof, including a light source, a reading head, a photoelectric receiving module, and a signal processing system. The light source is configured to generate two linearly polarized lights having characteristics of overlapping, polarization orthogonal, and fixed frequency difference. The reading head is configured to receive two beams of polarized lights and be respectively incident on a surface of a moving measuring grating to generate a +1-order diffracted light and a ?1-order diffracted light. The photoelectric receiving module is configured to receive the +1-order diffracted light and the ?1-order diffracted light to form two paths of beat frequency signals. The signal processing system is configured to perform differential calculation on the two paths of the beat frequency signals to realize a displacement measurement of single diffraction of the measuring grating for four-fold optical subdivision.
    Type: Application
    Filed: March 31, 2022
    Publication date: July 14, 2022
    Inventors: WENHAO LI, ZHAOWU LIU, WEI WANG, HONGZHU YU, RIGALANTU JI, XUEFENG YAO